太赫兹科学与电子信息学报, 2016, 14 (2): 241, 网络出版: 2016-12-07
屏蔽厚度对电路板充电防护仿真分析
Simulation of the influence of shielding layer’s thickness on charging hazard of circuit board
卫星深层介质充放电 双面覆铜接地电路板 地球同步轨道 Geant-RIC方法 deep dielectrics charge and discharge hazards double grounded circuit board Geostationary Earth Orbit Geant4-RIC method
摘要
卫星深层介质充放电是造成卫星异常的主要空间环境效应之一。本文基于地球同步轨道(GEO)为目标防护设计轨道，以NASA4002A上提出的GEO轨道最恶劣电子能谱作为环境输入参数，采用Geant4-RIC方法计算了不同屏蔽层厚度下，双面覆铜接地的厚度为2.0 mm的电路板介质的深层介质充电电场。计算结果表明，随着屏蔽层厚度的增加，介质内最大充电电场呈指数降低，当屏蔽层厚度大于1.4 mm等效Al时，充电电场小于106 V/m，没有深层介质放电风险。
Abstract
Deep dielectric charging and discharge is one of the most harmful factors for spacecraft. In this paper，by using GEANT4-RIC method，the deep dielectric charging electric field of 2.0 mm thickness circuit board is calculated under the worst-case internal spectrum in Geostationary Earth Orbit(GEO) from NASA4002A. The simulation result shows that the maximum dielectric charging electric field decreases exponentially with the increasing of the thickness of the shielding layer. When the thickness of the shielding layer is above 1.4 mm Al，the maximum electric field is below 106 V/m，which shows no deep dielectric discharge hazard.
于向前, 陈鸿飞, 王建昭, 宗秋刚, 邵思霈, 邹鸿, 施伟红, 贾向红, 邹积清, 仲维英, 陈哲. 屏蔽厚度对电路板充电防护仿真分析[J]. 太赫兹科学与电子信息学报, 2016, 14(2): 241. YU Xiangqian, CHEN Hongfei, WANG Jianzhao, ZONG Qiugang, SHAO Sipei, ZOU Hong, SHI Weihong, JIA Xianghong, ZOU Jiqing, ZHONG Weiying, CHEN Zhe. Simulation of the influence of shielding layer’s thickness on charging hazard of circuit board[J]. Journal of terahertz science and electronic information technology, 2016, 14(2): 241.
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