红外技术, 2016, 38 (12): 1073, 网络出版: 2017-01-03  

热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响

Influence of the Micro Defect on the Stability of Ge-base Antireflective Films in Tropical Rainforest Environment
作者单位
1 昆明物理研究所,云南 昆明 650223
2 昆明北方红外技术股份有限公司,云南 昆明 650217
3 国营第二九八厂,云南 昆明 650114
摘要
采用投样试验的方法,在锗基底上镀制红外减反射膜样品,将样品放置在西双版纳热带雨林环境进行试验,通过傅里叶红外光谱仪、扫描电镜等测量手段,分析了试验前后样品的变化特性,对镀膜样品在热带雨林环境中的稳定性进行了研究。实验发现,在热带雨林环境中薄膜微缺陷的腐蚀、扩展是导致薄膜失效的主要原因。
Abstract
The method of sample test was taken, in which infrared antireflective films samples were deposited on Ge substrate, and samples were tested in tropical rainforest environment in Xishuangbanna. By using FT-IR spectrometer and SEM, the characteristics of samples before and after the experiment was analyzed. The stability of samples in tropical rainforest environment was studied. The experiment results show that the corrosion and expansion from micro defect sites in the films are one of the main influence factors for the failure of the films in the tropical rain forest.

王乔方, 任跃, 字正华, 王贵全, 刘剑, 张宏坤, 杨玉萍, 彭代东, 孙娟, 王茜. 热带雨林环境中锗基底薄膜微缺陷对减反射膜环境稳定性的影响[J]. 红外技术, 2016, 38(12): 1073. WANG Qiaofang, REN Yue, ZI Zhenghua, WANG Guiquan, LIU Jian, ZHANG Hongkun, YANG Yuping, PENG Daidong, SUN Juan, WANG Qian. Influence of the Micro Defect on the Stability of Ge-base Antireflective Films in Tropical Rainforest Environment[J]. Infrared Technology, 2016, 38(12): 1073.

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