红外与激光工程, 2017, 46 (1): 0106002, 网络出版: 2017-03-29   

用于原子重力仪的外腔半导体激光器的两种稳频方法比较

Comparison between two frequency stabilization methods of external cavity diode laser for atom gravimeter
作者单位
北京长城计量测试技术研究所 计量与校准技术国防科技重点实验室, 北京 100095
摘要
在铷原子气室中实现了饱和吸收谱稳频法和消多普勒的双色谱稳频法, 以给在建的原子干涉重力仪系统选择合适的激光稳频方法。介绍了两种稳频方法的基本原理及实验细节。通过调整光路设计、自制低噪声光电探测器以及应用数字锁定模块, 获得了良好的鉴频误差信号。每种方法都搭建了两套稳频系统并在3 000 s采集时间内保持锁定。激光器在经饱和吸收法和消多普勒双色谱法锁定后, 激光频率波动分别为16.2 kHz和31.4 kHz, 相应于在10 s采样时间下分别获得4.21×10-11和8.18×10-11的频率稳定度; 相比之下, 激光器自由运转时, 频率波动和稳定度分别为629 kHz和1.64×10-9。在原子重力仪系统小型化的需求下详述了两种稳频方法的优缺点, 比较而得消多普勒的双色谱稳频法在原子干涉重力仪的小型化模块化发展方向不失为具有潜力的一种选择。
Abstract
In order to choose appropriate frequency stabilization method in the atom gravimeter system under construction, Doppler-free dichroic atomic vapor laser lock(Doppler-free DAVLL) and saturated absorption spectroscopy(SAS) method were implemented on Rubidium atomic vapor. Basic principle and experimental details of both frequency stabilization methods were introduced. With restructuring of optical path and applying of self-made low noise photoelectric detector as well as digital lock module, excellent error signal was obtained. For each method, two sets of locking system were built and kept locked during 3 000 s′ data acquisition. A frequency fluctuation of 629 kHz when the laser is free running and of 16.2 kHz & 31.4 kHz after locked by SAS and Doppler-free DAVLL were calculated respectively, corresponding to a frequency stability of 1.64×10-9 in the condition of free running and 4.21×10-11 & 8.18×10-11 after locked for averaging time of 10 s. The strength and weakness of both methods were elaborated with the demand of system miniaturization. After compared with SAS, Doppler-free DAVLL isconsidered to be a promising choice for miniaturization and modularization in atom interferometry gravimeter.

马慧娟, 茹宁, 王宇. 用于原子重力仪的外腔半导体激光器的两种稳频方法比较[J]. 红外与激光工程, 2017, 46(1): 0106002. Ma Huijuan, Ru Ning, Wang Yu. Comparison between two frequency stabilization methods of external cavity diode laser for atom gravimeter[J]. Infrared and Laser Engineering, 2017, 46(1): 0106002.

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