基于Landau-de Gennes理论, 利用松弛迭代法, 研究了电场对垂直排列(VA)液晶薄盒和反扭曲向列相(ITN)液晶薄盒的影响。两系统在相同条件下的倾角变化相同, 且系统双轴性与本征值的变化只取决于倾角的变化。研究表明, 当盒厚大于一定临界值时, 液晶系统一直处于正序参数态, 此时ITN 薄盒的扭曲角由线性排列逐渐变化到呈45°角排列; 当小于此临界盒厚时, 在一定电压下会出现负序参数单轴态, 此时ITN薄盒的扭曲角会偏离线性变化出现回滞。

Based on the Landau-de Gennes theory, the influence of electric field on the state of liquid crystal (LC) within the thin vertical aligned (VA) cell and the thin inverse twist nematic (ITN) cell has been investigated, using the relaxation iterative method. Two systems have the same tilt angle behavior under the same electric field and same cell gap. Meanwhile, the variation of biaxialities and eigenvalues only depend on the tilt angle. When the cell gap is bigger than a critical gap, the LC system has positive order parameter, and the twist angle of ITN changes from lineation to nearly 45° with the increase of electric field. When the cell gap is under the critical value, a negative order parameter uniaxial state will appear at a certain electric field. The variation of the twist angle in the ITN cell shows a deviation from lineation as the electric filed increasing, and this variation will show a hysteresis effect within a certain electric field range.