半导体光电, 2017, 38 (4): 515, 网络出版: 2017-08-30
基于EMVA1288标准的图像传感器辐照效应参数测试系统的研制
Development of Image Sensor Radiation Effect Parameters Testing System Based on EMVA1288 Standard
光电图像传感器 辐照效应 测试系统 EMVA1288国际标准 photoelectric image sensor radiation effect testing system EMVA1288 international standard
摘要
提出了光电图像传感器辐照效应参数测试需要解决的问题, 简述了光电图像传感器参数测试国际标准(EMVA1288)的原理和要求, 建立了基于EMVA1288国际标准的光电图像传感器辐照效应测试系统, 并进行了辐照试验验证。验证试验表明: 该系统能对光电图像传感器辐照前后的时域、空域和光谱类参数进行测试, 较好地解决了光电图像传感器辐照效应测试难题, 如测试效率、数据可比对、兼容和拓展性等, 具有较好的推广应用前景。
Abstract
The problem of photoelectric image sensor radiation effect parameter measurement is put forward in this paper. The test principle and requirements of the international standard (EMVA1288) of the photoelectric image sensors parameter test are introduced. A photoelectric image sensor radiation effect testing system based on EMVA1288 international standard is built. The radiation experiment is carried out to validate the testing system. The experimental results show that the testing systems can test the parameters of time, space, and spectrum domain before and after radiation. The testing system has solved the photoelectric image sensor radiation effect test problems such as test efficiency, test data comparison, compatibility and extension, and it has good application prospects.
王祖军, 薛院院, 姚志斌, 马武英, 何宝平, 刘敏波, 盛江坤. 基于EMVA1288标准的图像传感器辐照效应参数测试系统的研制[J]. 半导体光电, 2017, 38(4): 515. WANG Zujun, XUE Yuanyuan, YAO Zhibin, MA Wuying, HE Baoping, LIU Minbo, SHENG Jiangkun. Development of Image Sensor Radiation Effect Parameters Testing System Based on EMVA1288 Standard[J]. Semiconductor Optoelectronics, 2017, 38(4): 515.