光学学报, 2017, 37 (9): 0914004, 网络出版: 2018-09-07
关联“热像”特性的缺陷带通成像检测技术 下载: 767次
Defect Inspection by Band-Pass Imaging Related to Hot Image Property
摘要
“热像”是造成高功率固体激光装置光学元件损伤的重要物理机制。理论分析了相位缺陷经过非线性传输引起的“热像”特性,提出了带通成像提取引起“热像”的相位缺陷关键频谱方法,构建具有典型特征的16个相位缺陷,利用3种光路结构,量化分析了“热像”特性与带通成像特性间的关系,并获得了缺陷带通成像的相对亮度与“热像”强度的线性关系,相关程度与光学构型和带通滤波参数有关。研究结果对“热像”预判有重要意义,为高功率激光装置相位缺陷的检测奠定了技术基础。
Abstract
In high power solid laser facility, the hot images are an important physical mechanism in damaging the optical components. The hot image property induced by defects in nonlinear propagation is analyzed theoretically. The phase defect key spectrum method of hot image extracted by band-pass imaging technology is proposed. The typical 16 phase defects are constructed to analyze the quantitative relationship between hot image property and band-pass imaging property with three optical types, and the linear relationship between hot image intensity and relative brightness of band-pass image are proposed. It shows that the correlation coefficient is connected with the optical type and band-pass filter parameters. The results have great significance for hot images and lay a technique foundation for phase defects detection in high power laser systems.
李平, 韩伟, 王伟, 贾怀庭, 黄晚晴, 王芳, 周丽丹, 冯斌, 朱启华, 郑万国. 关联“热像”特性的缺陷带通成像检测技术[J]. 光学学报, 2017, 37(9): 0914004. Ping Li, Wei Han, Wei Wang, Huaiting Jia, Wanqing Huang, Fang Wang, Lidan Zhou, Bin Feng, Qihua Zhu, Wanguo Zheng. Defect Inspection by Band-Pass Imaging Related to Hot Image Property[J]. Acta Optica Sinica, 2017, 37(9): 0914004.