采用光配向技术使PI获得配向能力并制得IPS型LCD, 通过AOI光学自动检测设备以及DMS光学测量系统对在不同PI固烤时间和UV曝光能量下获得样品的预倾角、对比度及穿透率进行了量测, 并研究了各条件下样品的残影(Image Sticking)性能。结果显示: 在900~2 700 s, 400~600 mJ/cm2范围内, 固烤时间和曝光能量对LCD光学性能影响较小, 但对残影性能影响较大, IS随曝光量增大有恶化的趋势, 且该趋势在高亚胺化程度下趋于平缓; 调整固烤时间及曝光能量可以获得较佳的残影性能, 固烤时间1 800 s, 曝光能量400~500 mJ/cm2条件的LCD残影性能较佳。

The alignment ability of polyimide was obtained by Photo-Alignment process, and then IPS type LCDs was prepared in the experiment. Pre-tilt angle, contrast ratio and transmittance of LCD samples prepared under different post-bake time and UV dosage were characterized by AOI (Automated Optical Inspection) and DMS LCD photoelectric measuring system. Besides, image sticking (IS) of all the conditions was studied. The results showed that the post-bake time and UV dosage ranged between 900~2 700 s and 400~600 mJ/cm2 had little effect on optical performance and these two factors had obvious influence on IS. IS had a tendency to deteriorate with the increasing of UV Dosage, and the trend tended to be gentle under the condition of high imidization. Excellent IS performance could be obtained by adjusting the post-bake time and UV dosage. The LCD samples showed the best IS performance under the conditions of post-bake 1 800 s and UV dosage 400~500 mJ/cm2.