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Surface characterization of ICF capsule by AFM-based profilometer

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Abstract

Outside surface fluctuations of inertial confinement fusion (ICF) capsule greatly affect the implosion performance. An atomic force microscope (AFM)-based profilometer is developed to precisely characterize the capsule surface with nanometer resolution. With the standard nine surface profiles and the complete coverage data, 1D and 2D power spectra are obtained to quantitatively qualify the capsule. Capsule center fast aligning, orbit traces automatic recording, 3D capsule orientation have been studied to improve the accuracy and efficiency of the profilometer.

Newport宣传-MKS新实验室计划
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DOI:10.1017/hpl.2017.20

收稿日期:2016-10-08

录用日期:2017-01-23

网络出版日期:2017-05-05

作者单位    点击查看

Jie Meng:Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Xuesen Zhao:P.O.Box 413, Harbin Institute of Technology, Harbin 150001, PR China
Xing Tang:Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Yihao Xia:Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Xiaojun Ma:Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China
Dangzhong Gao:Research Center of Laser Fusion, CAEP, Mianyang 621000, PR China

联系人作者:Dangzhong Gao(dgaocn@163.com)

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引用该论文

Jie Meng, Xuesen Zhao, Xing Tang, Yihao Xia, Xiaojun Ma, and Dangzhong Gao, "Surface characterization of ICF capsule by AFM-based profilometer," High Power Laser Science and Engineering 5(3), e21 (2017)

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