光学学报, 2018, 38 (2): 0204002, 网络出版: 2018-08-30
基于微通道板选通的飞行时间测量技术 
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Measurement Technology of Time of Flight Based on Gated Microchannel Plates
探测器 电子能谱 飞行时间 微通道板 选通 时间分辨率 detectors electronic energy spectrum time of flight microchannel plate gating temporal resolution
摘要
研究了基于微通道板(MCP)选通技术的电子飞行时间(TOF)测量系统。调节MCP选通脉冲延时,使得电子和选通脉冲同时到达MCP,从而产生动态图像。利用高速示波器获得电子在50 cm漂移区的TOF。当阴极电压为-3.5 kV时,测得电子从阴极到MCP的TOF约为15 ns。改变阴极电压,获得了TOF与电子能量之间的关系。结果表明,随着电子能量的增大,TOF不断减小。该TOF测量系统的时间分辨率为88 ps。
Abstract
A time of flight (TOF) measurement system based on the gated microchannel plate (MCP) technology is reported. The electrons and the strobe pulse can simultaneously arrive at the MCP under a suitable MCP strobe pulse delay, and so that dynamic images can be produced. The TOF of electrons at the drift space of 50 cm is measured by using a high speed oscilloscope. When the cathode voltage of -3.5 kV is applied, it takes electrons about 15 ns to travel from cathode to MCP. The relationship between the TOF and electron energy is obtained via tuning the cathode voltage. The results show that the TOF decreases with the increase of electron energy, and the temporal resolution of the TOF measurement system is 88 ps.
蔡厚智, 刘进元, 付文勇, 雷云飞, 廖昱博, 龙井华. 基于微通道板选通的飞行时间测量技术[J]. 光学学报, 2018, 38(2): 0204002. Houzhi Cai, Jinyuan Liu, Wenyong Fu, Yunfei Lei, Yubo Liao, Jinghua Long. Measurement Technology of Time of Flight Based on Gated Microchannel Plates[J]. Acta Optica Sinica, 2018, 38(2): 0204002.
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