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Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments

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Abstract

A new crystal spectrometer for application in X-ray opacity experiments is proposed. The conditions necessary to yield broad spectral coverage with a resolution ${>}$500, strong rejection of hard X-ray backgrounds and negligible source broadening for extended sources are formulated. In addition, the design, response modeling and reporting of an elliptical crystal spectrometer in conjunction with a linear detector are presented. The measured results demonstrate the performance of the new crystal spectrometer with a broad energy coverage range, high spectral resolution, and high luminosity (good collection efficiency). This spectrometer can be used in combination with point-projection backlighting techniques as utilized in X-ray opacity experiments. Specifically, the X-ray source, transmission and self-emission spectra of the sample can be measured simultaneously in a single shot, which can reduce the experimental uncertainties from shot-to-shot fluctuations. The new crystal spectrometer has been used in the X-ray opacity experiment to precisely measure the aluminum $K$-absorption edge shift in the energy range around 1.560 keV in strongly compressed matter. It is demonstrated that the spectrometer can be used to realize measurements of new and unpredictable physical interactions of interest, as well as basic and applied high-energy-density science.

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DOI:10.1017/hpl.2017.33

基金项目:The authors would like to thank Professor Sha-Li Xiao from Chongqing University of China for helpful discussions, and the SGII laser facility crew for laser operation. This work was supported by the National Natural Science Foundation of China (Nos. 11575168 and 61475146) and the funding through IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240, China.

收稿日期:2017-06-20

录用日期:2017-11-12

网络出版日期:2017-11-20

作者单位    点击查看

Ruirong Wang:Shanghai Institute of Laser Plasma, Shanghai 201800, China
Honghai An:Shanghai Institute of Laser Plasma, Shanghai 201800, China
Zhiyong Xie:Shanghai Institute of Laser Plasma, Shanghai 201800, China
Wei Wang:Shanghai Institute of Laser Plasma, Shanghai 201800, China

联系人作者:Ruirong Wang(wangrr59@sina.com)

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引用该论文

Ruirong Wang, Honghai An, Zhiyong Xie, and Wei Wang, "Performance of an elliptical crystal spectrometer for SGII X-ray opacity experiments," High Power Laser Science and Engineering 6(1), e3 (2018)

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