红外技术, 2018, 40 (8): 725, 网络出版: 2018-08-29
材料表面发射率测量技术研究进展
Research and Progress on Material Surface Emissivity Measurement
发射率 辐射测温 量热法 能量比较法 多波长法 计量比对 emissivity radiation thermometers calorimetric energy comparison multi-wavelength metrology comparison
摘要
材料表面发射率是描述物体热辐射特性的重要参数, 与辐射传热设计、测温、热像检测和**隐身等技术密切相关。综述了量热法、能量法和多波长法测量材料表面发射率的研究进展, 分析了材料发射率及其测量不确定度的影响因素, 介绍了发射率测量标准样品的研制及国际间比对, 最后展望了该领域的发展趋势。
Abstract
Material surface emissivity is an important thermophysical property for radiation heat transfer, thermometers, thermography testing, infrared stealth, among others. In this paper, we review the techniques for measuring emissivity, such as calorimetric, energy comparison, and multi-wavelength techniques; describe the factors influencing material surface emissivity and the main uncertainty contribution for emissivity measurement; and introduce emissivity standard reference materials and perform an inter- comparison of emissivity measurements. Finally, we analyze the progress trend in this field.
刘波, 郑伟, 李海洋. 材料表面发射率测量技术研究进展[J]. 红外技术, 2018, 40(8): 725. LIU Bo, ZHENG Wei, LI Haiyang. Research and Progress on Material Surface Emissivity Measurement[J]. Infrared Technology, 2018, 40(8): 725.