红外与激光工程, 2018, 47 (5): 0531001, 网络出版: 2018-09-12  

基于寄生回路的导引头传递函数及测试方法

Transfer function and test method of seeker based on parasitic loop
作者单位
1 北京理工大学 机电学院, 北京 100081
2 空军装备研究院 装备总体论证研究所, 北京 100076
3 中国运载火箭技术研究院, 北京 100076
摘要
为了反应真实导引头在隔离度作用下的输出特性, 提出了一种基于隔离度寄生回路的导引头传递函数概念及测试方法。通过建立导引头隔离度模型, 推导了不同干扰力矩作用下的隔离度传递函数, 对隔离度寄生回路稳定域进行分析, 并得到了寄生回路失稳频率变化规律。建立了包含寄生回路的真实导引头传递函数模型, 对真实导引头传递函数的频域特性和时域特性进行了仿真分析。最后, 提出了基于寄生回路的导引头传递函数半实物仿真测试方法, 通过测试从而得到真实导引头模型, 提高导引头系统建模的准确性。
Abstract
In order to reflect the output characteristics of real seeker under disturbance rejection rate, a concept and test method of seeker transfer function based on disturbance rejection rate parasitic loop were proposed. Through the establishment of seeker disturbance rejection rate model, the transfer function of disturbance rejection rate with effect of different disturbances was derived. The stability region of disturbance rejection rate parasitic loop was analyzed, and the regulation of parasitic loop instability frequency was obtained. The transfer function model of seeker with parasitic loop was established, and the frequency characteristics and time domain characteristics of the real seeker model were simulated and analyzed. Finally, the hardware-in-loop simulation test method of seeker transfer function based on parasitic loop was proposed. Through the hardware in the loop simulation test, the real seeker model is obtained, so as to improve the accuracy of seeker modeling.

刘石祥, 尹健, 杜肖, 陈思远. 基于寄生回路的导引头传递函数及测试方法[J]. 红外与激光工程, 2018, 47(5): 0531001. Liu Shixiang, Yin Jian, Du Xiao, Chen Siyuan. Transfer function and test method of seeker based on parasitic loop[J]. Infrared and Laser Engineering, 2018, 47(5): 0531001.

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