提出了一种基于嵌入式系统和WiFi无线控制的接触模式原子力显微镜(AFM)系统。该AFM系统直接由迷你型移动电源给扫描与反馈电路及嵌入式系统等供电; 嵌入式系统由微型电脑树莓派和微小型AD&DA模块构成, 通过WiFi与笔记本电脑实现无线数据通信。利用这一方法, 成功研发了无线控制式AFM系统, 并开展了微纳米样品的扫描成像实验。实验结果表明, 该AFM系统的横向分辨率达到纳米量级, 纵向分辨率达到0.1 nm, 最大扫描范围为3.6 μm×3.6 μm。该系统的显著特点是无需交流市电供电, 无需直流高压电源, 也无需与计算机之间的线缆连接, 可在约100 m远处通过无线控制的方式实现AFM的扫描成像。这一新型AFM系统, 不仅能够在微纳米技术的常规领域得到应用, 而且在野外考察、隔离环境、真空条件、气体氛围环境及星际探测等特殊领域具有广阔的应用前景。

This paper proposes a contact mode Atomic Force Microscope (AFM) based on an embedded system and WiFi control. This AFM utilizes a portable power supply to drive the scanning/feedback circuit and an embedded system. The embedded system, which consists of a micro-computer (Raspberry Pi) and a micro AD&DA module, realizes WiFi-based communication with a laptop computer. Using this approach, a wirelessly controlled AFM is developed and experiments are performed using different samples. The results indicate that the horizontal resolution of the AFM is in nanometer order, and vertical resolution is 0.1 nm. Furthermore, the AFM can achieve a maximum scan range of 3.6 m×3.6 m. The advantages of the proposed setup include the circumvention of the need for commercial and high-voltage DC power supplies, and the obviation of a cable connection between the embedded system and the laptop computer. The system is capable of realizing AFM scanning and imaging via wireless control at approximately 100 m away. This AFM can be potentially applied in most micro/nano-technology fields. Moreover, it allows for special applications in outdoor investigations, isolated spaces, vacuum conditions, gas environments, and even interstellar exploration.