研制了一种新型光谱感光仪，其特点是宽光谱 (340 nm~900 nm)，大曝光面 (202 mm×90.5 mm)，且面上具有多阶梯光强；制备具有 18级光密度值的高精密阶梯光楔板，每个台阶的光密度值误差不大于 0.01；根据光源的光谱特性镀制滤光膜，消除光栅二级光谱。自动控制采集系统采用 LabVIEW与 PLC一体机开发，水平方向采用光栅位移传感器构成闭环控制，波长定位偏差小于 0.05 nm；竖直方向采用线性补偿方法，高度位置偏差小于 0.05 mm。仪器能够自动测量光楔板上不同波长不同光强区域的单位面积光功率，用快门控制曝光时间，在宽光谱范围内对感光材料进行一次曝光。在显影定影后，用光密度计测量其光密度值，根据国标 (GB10557-89)绘制出感光材料某一确定光密度值的光谱灵敏度曲线。

A new type of spectrosensitometer has been developed, which is characterized by a wide spectrum range of 340 nm ~ 900 nm and a large exposed area of 202 mm × 90.5 mm with multi-step light intensities on it. The optical density value error of each step on the 18-step wedge with high precision is not greater than 0.01. The film filter evaporated according to the spectral characteristic of the light source can eliminate the secondary spectrum of grating. The automatic control acquisition system is developed by LabVIEW and all-in-one PLC with HMI. In the ho-rizontal direction, the grating displacement sensor is adopted to form the closed-loop control, and the wavelength positioning deviation is less than 0.05 nm. Linear compensation method is adopted in the vertical direction with a height deviation of less than 0.05 mm. The spectrosensitometer automatically measures the optical power per unit area of lights with different wavelengths and light intensities on the step wedge. The shutter controls exposure time. Photosensitive materials are once exposed within the scope of the wide spectrum. After being developed and fixed, the optical density value can be measured by densitometer. The spectral sensitivity curve of a photosensitive ma-terial with a certain optical density value can be drawn according to the national standard (GB10557-89).