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脉冲激光辐照CMOS相机的图像间断现象及机理

Image interrupt effect and mechanism of pulse laser irradiated CMOS camera

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摘要

为了研究脉冲激光辐照CMOS相机时拍摄图像产生间断现象的原因, 利用1 064 nm脉冲激光对卷帘快门式CMOS相机进行了辐照实验。在获得的图像中观测到了间断现象, 表现为垂直方向上的亮区和暗区, 计算表明各帧图像中暗区的行数为固定值。根据CMOS图像传感器积分方式和扫描机制, 分析了图像间断现象的形成机理为卷帘快门式CMOS存储的不同时性。理论计算结果与实验结果一致, 并理论分析了完全无暗区图像存在的原因。提出了基于多帧间断图像采用拼接手段获得完整连续图像的方法, 得到的图像与直接拍摄图像基本一致。

Abstract

Irradiation experiments with a 1 064 nm pulse laser were conducted to investigate the image interrupt effect of pulse laser irradiating CMOS camera with rolling shutter. Image interrupt effects were observed in the experimental results with bright area and dark area in the vertical direction. Calculation results show that the number of dark area rows is a constant. According to the integrating mode and scanning mode of CMOS image sensor, the formation mechanism of image interrupt effect is the storage asynchronism of CMOS with rolling shutter. Theoretical calculation value fit well with the experimental result. The reason of the existing of image without dark area was also theoretically explained. Method based on stitching several interrupted images was proposed to obtain a full image without interruption, which was very similar to the experimental imaging results.

Newport宣传-MKS新实验室计划
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中图分类号:TN249

DOI:10.3788/irla201948.0306002

所属栏目:激光技术及应用

基金项目:国家自然科学基金(11504420)

收稿日期:2018-10-10

修改稿日期:2018-11-20

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作者单位    点击查看

周旋风:中国洛阳电子装备试验中心,河南 洛阳 471003
陈前荣:中国洛阳电子装备试验中心,河南 洛阳 471003
王彦斌:中国洛阳电子装备试验中心,河南 洛阳 471003
朱荣臻:中国洛阳电子装备试验中心,河南 洛阳 471003
李 华:中国洛阳电子装备试验中心,河南 洛阳 471003
任广森:中国洛阳电子装备试验中心,河南 洛阳 471003

联系人作者:周旋风(zhouxuanfeng2012@163.com)

备注:周旋风(1988-), 男, 助理研究员, 博士, 主要从事光电对抗技术方面的研究。

【1】Kazuya Yonemoto. CCD/CMOS Image Sensor no Kiso to Ouyou[M]. Chen Rongting, Transl. Beijing: Science Press, 2006: 6-10. (in Chinese)
Kazuya Yonemoto. CCD/CMOS图像传感器基础与应用[M]. 陈榕庭, 译. 北京: 科学出版社, 2006: 6-10.

【2】Jiang Wenjie, Zeng Xuewen, Shi Jianhua. Photoelectric Technology[M]. Beijing: Science Press, 2009: 219-223. (in Chinese)
江文杰, 曾学文, 施建华. 光电技术[M]. 北京: 科学出版社, 2009: 219-223.

【3】Wang Qingyou. Application Technology of Image Sensor[M]. Beijing: Electronic Industry Press, 2013: 157-170. (in Chinese)
王庆友. 图像传感器应用技术[M]. 北京: 电子工业出版社, 2013: 157-170.

【4】Li Jijun, Du Yungang, Zhang Lihua, et al. Research progress on CMOS image sensors[J]. Laser & Optoelectronics Progress, 2009, 46(4): 45-52. (in Chinese)
李继军, 杜云刚, 张丽华, 等. CMOS图像传感器的研究进展[J]. 激光与光电子学进展, 2009, 46(4): 45-52.

【5】Shao Ming, Zhang Leilei, Zhao Wei, et al. Experiment study on saturation effect of high-repetition-rate laser jamming CMOS camera[J]. Laser Journal, 2013, 34(2): 16-17. (in Chinese)
邵铭, 张雷雷, 赵威, 等. 高重频脉冲激光对CMOS相机饱和干扰效果研究[J]. 激光杂志, 2013, 34(2): 16-17.

【6】Wang Ang. Research on the irradiation effects of CMOS image sensor under laser[D]. Changsha: National University of Defense Technology, 2014: 11-43. (in Chinese)
王昂. 可见光CMOS图像传感器的激光辐照效应研究[D]. 长沙: 国防科学技术大学, 2014: 11-43.

【7】Wang Ang, Guo Feng, Zhu Zhiwu, et al. Comparative study of hard CMOS damage irradiated by CW laser and single-pulse ns laser[J]. High Power Laser and Particle Beams, 2014, 26(9): 43-47. (in Chinese)
王昂, 郭锋, 朱志武, 等. 连续激光与单脉冲纳秒激光对CMOS的损伤效应[J]. 强激光与粒子束, 2014, 26(9): 43-47.

【8】Guo Feng, Zhu Rongzhen, Wang Ang, et al. Damage effect on CMOS detector irradiated by single-pulse laser[C]// International Symposium on Photoelectronic Detection and Imaging, Proc of SPIE, 2013, 8905: 890521.

【9】Wang Jingnan, Nie Jinsong. Experimental study on supercontinuum laser irradiating a visible light CMOS imaging sensor[J]. Infrared and Laser Engineering, 2017, 46(1): 0106004. (in Chinese)
王景楠, 聂劲松. 超连续谱光源辐照可见光CMOS图像传感器的实验研究[J]. 红外与激光工程, 2017, 46(1): 0106004.

【10】Lai Liping, Fu Bo, Zhang Rongzhu. Effect of broadband sources on electrical crosstalk of CMOS array[J]. Infrared and Laser Engineering, 2017, 46(1): 0120005. (in Chinese)
赖莉萍, 付博, 张蓉竹. 宽谱光源对CMOS阵列电串扰的影响[J]. 红外与激光工程, 2017, 46(1): 0120005.

【11】Guo Feng. Comparative study on the irradiation effect of the laser to CMOS and CCD[D]. Changsha: National University of Defense Technology, 2013: 17-26. (in Chinese)
郭锋. 激光对CMOS和CCD的辐照效应对比研究[D]. 长沙: 国防科学技术大学, 2013: 17-26.

【12】Shao Ming, Zhang Le, Zhang Leilei, et al. Comparative study saturation effect of 1.06 μm laser jamming CCD and CMOS cameras[J]. Journal of Applied Optics, 2014, 35(1): 163-167. (in Chinese)
邵铭, 张乐, 张雷雷, 等. 1.06 μm激光对CCD、CMOS相机饱和干扰效果对比研究[J]. 应用光学, 2014, 35(1): 163-167.

【13】Sheng Liang, Zhang Zhen, Zhang Jianmin, et al. Pixel upset effect and mechanism of CW laser irradiated CMOS camera[J]. Infrared and Laser Engineering, 2016, 45(6): 0606004. (in Chinese)
盛良, 张震, 张检民, 等. 连续激光辐照CMOS相机的像素翻转效应及机理[J]. 红外与激光工程, 2016, 45(6): 0606004.

【14】Liu Hailong, Li Xiangzhi, Xue Xucheng, et al. Vibration parameter detection of space camera by taking advantage of CMOS self-correlation Imaging of plane array of roller shutter[J]. Optics and Precision Engineering, 2016, 24(6): 1474-1481. (in Chinese)
刘海龙, 李祥之, 薛旭成, 等. 利用卷帘快门面阵CMOS自相关成像的空间相机振动参数检测[J]. 光学 精密工程, 2016, 24(6): 1474-1481.

引用该论文

Zhou Xuanfeng,Chen Qianrong,Wang Yanbin,Zhu Rongzhen,Li Hua,Ren Guangsen. Image interrupt effect and mechanism of pulse laser irradiated CMOS camera[J]. Infrared and Laser Engineering, 2019, 48(3): 0306002

周旋风,陈前荣,王彦斌,朱荣臻,李 华,任广森. 脉冲激光辐照CMOS相机的图像间断现象及机理[J]. 红外与激光工程, 2019, 48(3): 0306002

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