红外与激光工程, 2019, 48 (3): 0317003, 网络出版: 2019-04-06  

基于强度调制的编码孔径光谱偏振测量方法

Spectral polarization measurement method of coded aperture based on intensity modulation
乔亚 1,2张瑞 2,3景宁 2,3李金瑜 2,3王志斌 1,2
作者单位
1 中北大学 理学院, 山西 太原 030051
2 中北大学 山西省光电信息与仪器工程技术研究中心, 山西 太原 030051
3 中北大学 信息与通信工程学院, 山西 太原 030051
摘要
为实现在单次成像条件下获取图像的光谱偏振信息, 提出了一种基于强度调制的编码孔径测量方法。该方法采用消色差1/ 4波片、多级相位延迟器和检偏器组成的光谱偏振强度调制模块, 将入射光的Stokes参量各元素谱调制到不同的频率上, 利用编码孔径和色散棱镜组成的光谱成像系统对该调制光谱进行压缩编码, 并通过CCD进行探测。利用TwIST算法重构出经调制的光谱信息, 对各个频谱通道进行分离重构出Stokes元素谱。以单一像素点为例, 对入射光强度调制、光谱重构及Stokes参量的解调进行了数值模拟。结果表明: 该方法可实现对稀疏图像的光谱偏振信息的获取, 该过程仅需对图像进行一次测量, 因此具备高速获取能力。
Abstract
In order to acquire spectral polarization information of the image under single-frame imaging conditions, an encoding aperture measurement method based on intensity modulation was proposed. The method used the spectral polarization intensity modulation module composed of an achromatic 1/4 wave plate, a multistage phase retarder and an analyzer, and modulated the spectrum of each element of the Stokes parameters of the incident light to different frequencies. And the modulated spectrum was compressed and coded by a spectral imaging system composed of coded aperture and dispersive prism, and was detected by CCD. The modulated spectral information was reconstructed using the TwIST algorithm, and then the spectrum of Stokes elements can be reconstructed by further separating the spectrum channels. Taking a single pixel as an example, the modulation of incident light intensity modulation, spectral reconstruction, and demodulation of Stokes parameters were simulated numerically. The results show that this method can achieve the acquisition of spectral polarization information of sparse images. This process requires only one measurement of the image and therefore has a high-speed acquisition capability.

乔亚, 张瑞, 景宁, 李金瑜, 王志斌. 基于强度调制的编码孔径光谱偏振测量方法[J]. 红外与激光工程, 2019, 48(3): 0317003. Qiao Ya, Zhang Rui, Jing Ning, Li Jinyu, Wang Zhibin. Spectral polarization measurement method of coded aperture based on intensity modulation[J]. Infrared and Laser Engineering, 2019, 48(3): 0317003.

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