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TFT-LCD的Line Zara失效机制及改善

Failure mechanism and improvement of TFT-LCD Line Zara defect

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摘要

为了彻底改善TFT-LCD的Line Zara不良, 本文建立了Line Zara失效模型, 并分析了Line Zara失效机制, 其中Line Zara发生率与外力大小及玻璃弯曲形变程度成正比, 与框胶至柱状隔垫物距离、框胶粘结力成反比。基于Line Zara的失效机制, 针对性地提出了改善措施并进行了实验验证。实验结果表明, 减薄时的抛光工艺、减薄后运输箱的填充密度和框胶粘结力对Line Zara有显著的影响。随着抛光压力的减小和时间缩短, Line Zara发生率逐渐减少。随着运输箱中玻璃数量或隔垫物数量的增加, 运输箱的填充密度逐渐增大, 玻璃受外力发生的弯曲形变逐渐减小, 相应的Line Zara发生率逐渐减小; 当隔垫物为无尘纸时, 玻璃的弯曲形变最小, Line Zara发生率最低。此外, 当框胶与ITO粘结力增加12.5%、与PI粘结力增加66%后, Line Zara的发生率可降低至2%以下。TFT-LCD的Line Zara不良可通过降低抛光压力与时间、增加运输箱的填充密度和增加框胶粘结力彻底改善。

Abstract

In order to improve Line Zara defect thoroughly, the failure model of Line Zara was firstly built to analyze its failure mechanism. Analysis shows that Line Zara ratio is proportional to external force and glass bending deformation, and inversely proportional to sealant adhesive strength and distance from sealant to PS. Based on the failure mechanism, some improvements were specifically suggested and confirmed by experiments. The results show that the polishing process, packing density of transportation boxes after slimming and sealant adhesive strength have a significant effect on Line Zara ratio. The Line Zara ratio decreases with the decreasing of the polishing pressure and time. With the increasing of the number of glass or spacer in packing box, the packing density increases gradually, so the glass bending deformation decreases, which leads to Line Zara ratio’s decrease. When the type of spacer is air-laid paper, the glasses in box have the smallest bending deformation, the Line Zara ratio is lowest. In addition, the Line Zara ratio can be reduced to less than 2% when the sealant adhesive strength increases by 12.5% with ITO and 66% with PI. The Line Zara defect can be effectively improved by decreasing polishing pressure and time, increasing the packing density of transportation box and the sealant adhesive strength.

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中图分类号:TN141.9

DOI:10.3788/yjyxs20193406.0549

所属栏目:材料与器件

收稿日期:2018-10-29

修改稿日期:2019-01-29

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作者单位    点击查看

王 欢:成都京东方光电科技有限公司, 四川 成都 611731
于 翔:成都京东方光电科技有限公司, 四川 成都 611731
朱凤稚:成都京东方光电科技有限公司, 四川 成都 611731
苏彦新:成都京东方光电科技有限公司, 四川 成都 611731
沈武林:成都京东方光电科技有限公司, 四川 成都 611731
郁信波:成都京东方光电科技有限公司, 四川 成都 611731
刘 旭:成都京东方光电科技有限公司, 四川 成都 611731

联系人作者:王欢(wanghuancd@boe.com.cn)

备注:王 欢(1990-), 男, 甘肃庆阳人, 硕士, 2016年于华中科技大学获得硕士学历, 主要从事TFT-LCD新工艺开发与失效分析的研究工作。

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引用该论文

WANG Huan,YU Xiang,ZHU Feng-zhi,SU Yan-xin,SHEN Wu-lin,YU Xin-bo,LIU Xu. Failure mechanism and improvement of TFT-LCD Line Zara defect[J]. Chinese Journal of Liquid Crystals and Displays, 2019, 34(6): 549-555

王 欢,于 翔,朱凤稚,苏彦新,沈武林,郁信波,刘 旭. TFT-LCD的Line Zara失效机制及改善[J]. 液晶与显示, 2019, 34(6): 549-555

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