重力Mura不良一直是显示业内一种比较难以解决的顽疾。随着显示屏透过率及对比度的要求不断提高, 产品设计安全范围变得更小, 因此重力Mura不良的解决更是尤为关键。本文对显示屏内部特性因素进行了分析, 并通过工艺变更样品制作, 进行液晶量安全范围(LC Margin)实验测试。证明了引起LC Margin变化的主要因素为柱状隔垫物(PS)高度, 同时阵列基板上的源极信号体(S/D)膜层厚度和栅极(Gate)膜层厚度同样对LC Margin产生一定影响; CF基板上BM & OC &Blue 膜层厚度、玻璃厚度特性参数也会导致LC Margin发生变化; 在成盒(Cell)制作工艺中, PI 膜层厚度及液晶型号对LC Margin的产生影响虽然不大, 但也不容忽视; 通过这样的实验论证, 为业内研究提供相关依据, 也为企业提供验证经验, 保证产品的品质。

Poor gravity Mura has always been a difficult problem to solve in the display industry. With the increasing requirement of transmittance and contrast of display screen, product design Margin becomes smaller, therefore, the solution of gravity Mura is particularly critical. In this paper, the internal characteristic factors of the display screen are analyzed, and the LC Margin test is carried out by making sample with process change. It is proved that the main factor causing the change of LC Margin is the PS height. At the same time, the thickness of SD film and Gate film on Array glass also have some influence on LC Margin. The thickness of BM & OC & Blue film and the characteristic parameters of glass thickness on CF glass will also lead to the change of LC Margin. The thickness of PI film and the type of LC have little influence on the production of LC Margin, but it can not be ignored. Such experimental demonstration provides relevant basis for industry research, and also provides verification experience for enterprises to ensure the quality of products.