红外技术, 2019, 41 (12): 1124, 网络出版: 2020-01-09
红外焦平面探测器贮存寿命试验研究
Research on Storage Lifetime Test of Infrared Focal Plane Array Detectors
摘要
本文以红外焦平面探测器为研究对象,在充分分析历年来国内红外焦平面探测器贮存寿命试验数据的基础上,研究了产品的失效模式和失效机理,并对贮存寿命试验前后关键参数指标变化量进行了深入分析,为全面评价红外焦平面探测器产品质量和可靠性提供了依据,为后续红外焦平面探测器的标准制修订工作奠定了基础。
Abstract
This paper focuses on infrared focal plane array detectors. Its work analyzes the test data from Chinese manufacturers and finds the failure mode and failure mechanism of the detectors. On this basis, the variation range of the key parameters after performing a storage lifetime test is analyzed. The research results provide the basis for a reliability evaluation of the infrared focal plane array detectors and lay the foundation of the standard preparation for the infrared(IR) detectors field.
刘若冰, 陈勤. 红外焦平面探测器贮存寿命试验研究[J]. 红外技术, 2019, 41(12): 1124. 刘若冰, 陈勤. Research on Storage Lifetime Test of Infrared Focal Plane Array Detectors[J]. Infrared Technology, 2019, 41(12): 1124.