利用高密度聚氯乙烯膜( HDPE)缺陷区与完整区同时刻温差特性，采用红外热成像技术对高密度聚氯乙烯膜进行缺陷检测。在持续热源作用下，对不同面积及形状的缺陷进行红外图像采集，记录膜表面不同区域的温 度，分析不同位置温度及红外缺陷阴影区随时间的变化规律，提取温度特征曲线及缺陷最佳检测时间范围。实验结果表明：缺陷区与完整区温度随时间变化趋势整体相同，但在相同时刻存在温度差异且红外图像采集时间为 10～20 min内温差值最明显，可视为缺陷最佳检测时间域，红外热像采集时间为 13 min时，红外图像边缘轮廓与实缺陷轮廓基本一致，该时间为最佳检测时间点。

Based on the simultaneous temperature difference of the HDPE film defect area and the intact area, defects of HDPE film were detected with infrared thermal imaging technology. Under the action of a continuous heat source: i) infrared images are collected for defects of different areas and shapes, ii) the temperature of different areas of the film surface is recorded, iii) the temperature changes of different locations and the shadow area of infrared defects with time are analyzed, and iv) finally, the temperature characteristic curve and the best defect detection time limit were studied. The experimental results show that the temperature trends of the defect and complete area are the same the whole time; however, there is a synchronous temperature difference, and the infrared temperature image acquisition time is clearly in the 10-20 mins. It can be regarded as the best detection time domain of the defect. When the thermal image acquisition time is 13 mins, the infrared image edge contour is the same as the real defect contour; therefore, it is the optimal detection time point.