光谱学与光谱分析, 2020, 40 (8): 2552, 网络出版: 2020-12-03  

基于高光谱技术建筑反射隔热涂料厚度检测技术的研究

The Study on Thickness Detection Technology of Reflective Thermal Insulation Coatings for Buildings Based on Hyperspectral Technology
作者单位
1 廊坊师范学院, 河北 廊坊 065000
2 北华航天工业学院, 河北 廊坊 065000
3 石家庄铁道大学交通运输学院, 河北 石家庄 050043
4 北京农业信息技术研究中心, 北京 100097
摘要
作为一类新型建筑涂料, 反射隔热涂料凭借其节能、 环保等优势已广泛应用于建筑的施工建设; 建筑反射隔热涂料性能的高、 低直接影响建筑节能、 环保性能的优劣, 且对建筑室内环境具有较大影响。 建筑反射隔热涂料主要通过对太阳辐射(可见光-近红外)与建筑辐射(热红外)的反射、 吸收等作用实现其节能、 环保作用。 对于特定建筑反射隔热涂料, 其与光的相互作用主要取决于涂料的施工参量, 如涂料施工厚度。 利用高光谱技术定量分析建筑反射隔热涂料的反射、 吸收特性, 研究涂料施工参量(厚度)对建筑反射隔热涂料性能的影响规律, 为涂料施工检测提供科学技术支撑。 研究借助高光谱技术, 测定涂料不同施工厚度的光谱数据, 分析涂料光谱特征随施工厚度增加的演变规律, 研究可表征涂料施工厚度的涂料指数, 并将涂料光谱数据及由其构建的涂料指数分别与涂料厚度进行相关性分析, 提取并筛选对涂料施工厚度敏感的指标, 构建涂料施工厚度检测模型, 探寻适用于涂料施工厚度检测的方法。 研究表明: (1)位于420~1 070 nm区间的光谱数据对0.1~2.5 mm的涂料厚度较为敏感且其与涂料施工厚度的相关系数r均较高且相对稳定, 表明该光谱区间对涂料厚度的敏感性较好, 可用于涂料厚度的检测; (2)与原始光谱相比, 涂料指数可有效提升光谱对涂料厚度的敏感性, 在5类涂料指数中由484和479 nm构建的RCI指数是表征涂料厚度的最佳参量; (3)在5类涂料指数中, 基于RCI指数构建的涂料厚度检测模型的精度最高, 为最优模型, 其R2=0.973, RMSE=0.185, RPD=4.018。
Abstract
As a new type of building coatings, reflective heat insulation coatings have been widely used in building construction by virtue of its advantages of energy saving and environmental protection. The high and low performance of reflective heat insulation coatings directly affects the performance of building energy saving and environmental protection, and has a great impact on the indoor environment of buildings. Reflective thermal insulation coatings for buildings mainly achieve energy saving and environmental protection by reflecting and absorbing solar radiation (visible-near infrared) and building radiation (thermal infrared). For specific building reflective heat insulation coatings, the interaction between them and light mainly depends on the construction parameters, such as coating thickness. Therefore, hyperspectral technology is used to quantitatively analyze the reflection and absorption characteristics of building reflective heat insulation coatings, and to study the influence of coating construction parameters (thickness) on the performance of building reflective heat insulation coatings, so as to provide scientific and technological support for coating construction detection. With the help of hyperspectral technology, this study measured the spectral data of different coatings thickness, analyzed the evolution law of the spectral characteristics of coatings with the increase of the thickness of coatings, studied the coatings index which can characterize the thickness of coatings construction, and analyzed the correlation between the spectral data of coatings and the coatings index constructed by them and the thickness of coatings respectively. Selecting and screening the sensitive indicators of coatings construction thickness, building the thickness detection model of coatings construction, and searching for the method suitable for the thickness detection of coatings construction. The results show that: (1) the spectral data located in the 420~1 070 nm range are sensitive to the thickness of coatings 0.1~2.5 mm, and the correlation coefficient r with the thickness of coatings construction is high and phase-wise. For stability, it shows that the spectral range is sensitive to the thickness of coatings and can be used to detect the thickness of coatings; (2) Compared with the original spectrum, the coating index can effectively enhance the sensitivity of the spectrum to the thickness of coatings, and the RCI index constructed from 484 and 479 nm is the best parameter to characterize the thickness of coatings in the five categories of coatings index; (3) Among the five kinds of coatings indices, the model based on RCI index has the highest accuracy and is the best one, and its R2=0.973, RMSE=0.185, RPD=4.018.

李笑芳, 王延仓, 顾晓鹤, 王丽玫, 李晓鹏, 冯华, 陈亭宇. 基于高光谱技术建筑反射隔热涂料厚度检测技术的研究[J]. 光谱学与光谱分析, 2020, 40(8): 2552. LI Xiao-fang, WANG Yan-cang, GU Xiao-he, WANG Li-mei, LI Xiao-peng, FENG Hua, CHEN Ting-yu. The Study on Thickness Detection Technology of Reflective Thermal Insulation Coatings for Buildings Based on Hyperspectral Technology[J]. Spectroscopy and Spectral Analysis, 2020, 40(8): 2552.

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