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基于相位偏折的类镜面物体表面缺陷检测

Defect Detection in Mirror-Like Object Surface Based on Phase Deflection

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摘要

针对现代制造业中类镜面物体表面缺陷检测的问题,研究了基于相位测量偏折术的自动检测方法。采用相移结合格雷码编码法提取反射图像相位,通过判断局部相位异常识别缺陷。分析相位提取错误导致误检现象的原因,提出一种折叠相位周期级数校正的方法。该方法能解决相位展开过程中的周期错位问题,保证相位的准确提取,避免误检问题。实验结果表明,基于相位偏折原理的检测方法能够实现对类镜面物体表面缺陷的准确、可靠检测。

Abstract

To detect defects on mirror-like object surfaces in the modern manufacturing industry, an automatic detection method based on phase measuring deflectormetry is proposed. The phase of the reflected image is extracted by combining the phase shift and Gray code, and defects are identified by an analysis of local phase irregularities. In addition, the phase extraction error that leads to false detection is analyzed. A wrapped phase period index correction algorithm is proposed to prevent period misalignment during the phase unwrapping. Therefore, accurate phase extraction can be assured through the phase unwrapping algorithm, and false detection is avoided. Experimental results indicate that the proposed method can accurately and reliably detect mirror-like surface defects.

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中图分类号:TH741

DOI:10.3788/LOP57.031201

所属栏目:仪器,测量与计量

基金项目:国家自然科学基金、天津市自然科学基金;

收稿日期:2019-06-03

修改稿日期:2019-07-26

网络出版日期:2020-02-01

作者单位    点击查看

姜硕:天津大学精密测试技术及仪器国家重点实验室, 天津 300072
杨凌辉:天津大学精密测试技术及仪器国家重点实验室, 天津 300072
任永杰:天津大学精密测试技术及仪器国家重点实验室, 天津 300072
邾继贵:天津大学精密测试技术及仪器国家重点实验室, 天津 300072

联系人作者:邾继贵(jiguizhu_tju@163.com)

备注:国家自然科学基金、天津市自然科学基金;

【1】Kong F, Zhang C, Feng R H, et al. Automatic inspection system for car body paint defect [J]. Modern Paint & Finishing. 2017, 20(3): 57-61.
孔飞, 张川, 冯日华, 等. 汽车车身漆膜缺陷自动检测系统 [J]. 现代涂料与涂装. 2017, 20(3): 57-61.

【2】Zhang K. Study on fast detection method of defects on automobile painting surface [D]. Shanghai: Donghua University. 2015, 1-13.
张康. 汽车涂装表面瑕疵快速检测方法研究 [D]. 上海: 东华大学. 2015, 1-13.

【3】Knauer M C, Kaminski J, Hausler G. Phase measuring deflectometry: a new approach to measure specular free-form surfaces [J]. Proceedings of SPIE. 2004, 5457: 366-376.

【4】Yue H M, Li R, Pan Z P, et al. High quality fringe patterns captured from phase measuring deflectometry [J]. Acta Optica Sinica. 2017, 37(11): 1112004.
岳慧敏, 李绒, 潘志鹏, 等. 相位测量偏折术中高质量条纹的获取 [J]. 光学学报. 2017, 37(11): 1112004.

【5】Deng X T, Gao N, Zhang Z H. Calibration of system parameters based on direct phase measuring deflectometry [J]. Laser & Optoelectronics Progress. 2018, 55(6): 061204.
邓小婷, 高楠, 张宗华. 基于直接相位测量术的系统参数标定方法 [J]. 激光与光电子学进展. 2018, 55(6): 061204.

【6】Shao S C, Tao X P, Wang X K. On-machine surface shape measurement of reflective mirrors by ultra-precision turning based on fringe reflection [J]. Laser & Optoelectronics Progress. 2018, 55(7): 071203.
邵山川, 陶小平, 王孝坤. 基于条纹反射的超精密车削反射镜的在位面形检测 [J]. 激光与光电子学进展. 2018, 55(7): 071203.

【7】Wang Y M, Zhang Z H, Gao N. Review on three-dimensional surface measurements of specular objects based on full-field fringe reflection [J]. Optics and Precision Engineering. 2018, 26(5): 1014-1027.
王月敏, 张宗华, 高楠. 基于全场条纹反射的镜面物体三维面形测量综述 [J]. 光学精密工程. 2018, 26(5): 1014-1027.

【8】Bone D J, Bachor H A, Sandeman R J. Fringe-pattern analysis using a 2-D Fourier transform [J]. Applied Optics. 1986, 25(10): 1653-1660.

【9】Su X Y, Chen W J. Fourier transform profilometry: a review [J]. Optics and Lasers in Engineering. 2001, 35(5): 263-284.

【10】Halioua M, Liu H C. Optical three-dimensional sensing by phase measuring profilometry [J]. Optics and Lasers in Engineering. 1989, 11(3): 185-215.

【11】Schmit J, Creath K. Extended averaging technique for derivation of error-compensating algorithms in phase-shifting interferometry [J]. Applied Optics. 1995, 34(19): 3610-3619.

【12】Yi J Y. Study on mobile phone shell inside and outside surface quality inspection based on fringe projection and fringe reflection technologies [D]. Chengdu: University of Electronic Science and Technology of China. 2016.
易京亚. 基于条纹投影和条纹反射的手机壳内外表面质量检测方法 [D]. 成都: 电子科技大学. 2016.

【13】Wu Y X. Study on specular surface quality inspection based on optical three dimensional metrology [D]. Chengdu: University of Electronic Science and Technology of China. 2017.
吴雨祥. 基于光学三维成像的镜面物体表面质量检测方法研究 [D]. 成都: 电子科技大学. 2017.

【14】Li M Y. Study on the solar cell wafer surface quality inspection based on the fringe reflection technique [D]. Chengdu: University of Electronic Science and Technology of China. 2016.
李明阳. 基于条纹反射的太阳能电池硅晶片表面质量检测方法研究 [D]. 成都: 电子科技大学. 2016.

【15】Su X Y, Chen W J. Reliability-guided phase unwrapping algorithm: a review [J]. Optics and Lasers in Engineering. 2004, 42(3): 245-261.

【16】Wang X, Jia S H, Chen G D. A review of the study on phase unwrapping [J]. Chinese Journal of Scientific Instrument. 2005, 26(S2): 665-668.
王新, 贾书海, 陈光德. 相位去包裹技术进展 [J]. 仪器仪表学报. 2005, 26(S2): 665-668.

【17】Huntley M, Saldner H O. Shape measurement by temporal phase unwrapping: comparison of unwrapping algorithms [J]. Measurement Science and Technology. 1997, 8(9): 986-992.

【18】Saldner H O, Huntley J M. Temporal phase unwrapping: application to surface profiling of discontinuous objects [J]. Applied Optics. 1997, 36(13): 2770-2775.

【19】Lin H, Ma Z F, Yao C H, et al. 3D measurement technology based on binocular vision using a combination of gray code and phase-shift structured light [J]. Acta Electronica Sinica. 2013, 41(1): 24-28.
林焕, 马志峰, 姚春海, 等. 基于格雷码-相移的双目三维测量方法研究 [J]. 电子学报. 2013, 41(1): 24-28.

【20】Sun X Z, Su X Y, Zou X P. Phase-unwrapping based on complementary structured light binary code [J]. Acta Optica Sinica. 2008, 28(10): 1947-1951.
孙学真, 苏显渝, 邹小平. 基于互补型光栅编码的相位展开 [J]. 光学学报. 2008, 28(10): 1947-1951.

引用该论文

Jiang Shuo,Yang Linghui,Ren Yongjie,Zhu Jigui. Defect Detection in Mirror-Like Object Surface Based on Phase Deflection[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031201

姜硕,杨凌辉,任永杰,邾继贵. 基于相位偏折的类镜面物体表面缺陷检测[J]. 激光与光电子学进展, 2020, 57(3): 031201

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