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An online diagnosis technique for simultaneous measurement of the fundamental, second and third harmonics in one snapshot

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Abstract

A three-wavelength coherent-modulation-imaging (CMI) technique is proposed to simultaneously measure the fundamental, second and third harmonics of a laser driver in one snapshot. Laser beams at three wavelengths (1053 nm, 526.5 nm and 351 nm) were simultaneously incident on a random phase plate to generate hybrid diffraction patterns, and a modified CMI algorithm was adopted to reconstruct the complex amplitude of each wavelength from one diffraction intensity frame. The validity of this proposed technique was verified using both numerical simulation and experimental analyses. Compared to commonly used measurement methods, this proposed method has several advantages, including a compact structure, convenient operation and high accuracy.

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DOI:10.1017/hpl.2019.26

所属栏目:Research Articles

基金项目:This work is supported by the National Natural Science Foundation of China (NSFC) (Nos. 61827816, 61675215, and 11875308), the Scientific Instrument Developing Project of the Chinese Academy of Sciences (No. YJKYYQ20180024) and the Shanghai Sailing Program (No. 18YF1426600).

收稿日期:2018-10-17

录用日期:2019-06-10

网络出版日期:2019-08-14

作者单位    点击查看

Xue Dong:Joint Laboratory on High-Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, ChinaCenter of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
Xingchen Pan:Joint Laboratory on High-Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Cheng Liu:Joint Laboratory on High-Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
Jianqiang Zhu:Joint Laboratory on High-Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

联系人作者:Cheng Liu(chengliu@siom.ac.cn)

备注:This work is supported by the National Natural Science Foundation of China (NSFC) (Nos. 61827816, 61675215, and 11875308), the Scientific Instrument Developing Project of the Chinese Academy of Sciences (No. YJKYYQ20180024) and the Shanghai Sailing Program (No. 18YF1426600).

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引用该论文

Xue Dong, Xingchen Pan, Cheng Liu, and Jianqiang Zhu, "An online diagnosis technique for simultaneous measurement of the fundamental, second and third harmonics in one snapshot," High Power Laser Science and Engineering 7(3), e48 (2019)

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