强激光与粒子束, 2020, 32 (5): 054001, 网络出版: 2020-04-24
9 MeV,小于0.1 mm微焦点X射线源验证实验
Verification experiment of micro focus X-ray source with energy 9 MeV and beam size less than 0.1 mm
微焦点 高能X射线源 高亮度电子源 自由电子激光 高能工业CT micro focus high energy X-ray source high brightness electron source free electron laser high energy industrial CT
摘要
密度高、成像分辨率高、成像速度快的X射线数字成像检测需要高能微焦点大剂量X射线源,高品质电子源是实现这一X射线源的关键手段。基于中国工程物理研究院太赫兹自由电子激光的主加速器,验证了低发射度、低能散度的高亮度电子束实现高能微焦点的可行性,得到电子束半高全宽尺寸小于70 μm的9 MeV微焦点,并初步开展成像实验,双丝像质计焦斑清晰分辨9D号丝,丝直径0.13 mm。
Abstract
High-density, high-resolution, and high-speed X-ray digital imaging detection requires a high-energy microfocus and high-dose X-ray source. A high quality electron beam source is the key means to achieve this X-ray source. Based on the main accelerator of the terahertz free electron laser of the China Academy of Engineering Physics (CTFEL), a high-energy microfocus X-ray source achieved by the high-brightness electron beam with low emittance and low energy spread was verified. The 9 MeV electron beam with full width at half-maximum of less than 70 μm was obtained. An initial imaging experiment was also carried out. The focal spot of the dual-wire image quality meter clearly distinguished the 9D wire with a wire diameter of 0.13 mm.
李鹏, 王建新, 肖德鑫, 周征, 周奎, 李世根, 劳成龙, 沈旭明, 闫陇刚, 刘宇, 刘婕, 胡栋才, 吴岱, 杨兴繁, 黎明. 9 MeV,小于0.1 mm微焦点X射线源验证实验[J]. 强激光与粒子束, 2020, 32(5): 054001. Peng Li, Jianxing Wang, Dexin Xiao, Zheng Zhou, Kui Zhou, Shigen Li, Chenglong Lao, Xuming Shen, Longang Yang, Yu Liu, Jie Liu, Dongcai Hu, Dai Wu, Xingfan Yang, Ming Li. Verification experiment of micro focus X-ray source with energy 9 MeV and beam size less than 0.1 mm[J]. High Power Laser and Particle Beams, 2020, 32(5): 054001.