红外与激光工程, 2020, 49 (4): 0404004, 网络出版: 2020-05-27  

红外焦平面列级ADC数字读出电路测试技术研究 下载: 565次

Research on testing technology of column-level ADC in IRFPA digital readout circuits
作者单位
1 中国科学院上海技术物理研究所 中国科学院红外成像材料与器件重点实验室,上海 200083
2 中国科学院大学,北京 100049
摘要
数字化红外焦平面器件是焦平面发展的重要方向,其核心是读出电路集成高性能模数转换器(ADC)。分析了读出电路数字化输出后焦平面性能参数的评价方法,阐述了红外焦平面列级ADC的静态测试和动态测试方法,提出了基于斜坡电压输入的过采样原理测试ADC静态性能,提升无误码分辨率测试正确性。针对ADC静态测试和动态测试要求,结合Labview软件和数字采集卡搭建了软硬件测试平台,并通过一款数字焦平面芯片的测试,验证了测试方法和平台适用于行列级ADC数字化读出电路的测试评价。
Abstract
The digitalization of infrared focal plane arrays (IRFPA) is an important direction for the development of IRFPA, the core of which is the integration of high-performance analog-to-digital converter (ADC) in the readout circuits. In this paper, the digital outputs of readout circuits were discussed to evaluate the performances of IRFPA. Otherwise, the static and dynamic testing methods of column-level ADC in IRFPA were elaborated. Among them, the static performances of ADC were tested based on oversampling principle which improved the testing correctness of the no-missing code resolution. For the ADC static and dynamic testing requirements, combined with Labview software and digital signal acquisition equipments, a testing platform of high-performance ADC was built. Through testing a digital IRFPA, it is verified that the testing method and platform can be used for testing evaluation of column-level ADC in digital readout circuits.

岑懿群, 张君玲, 陈洪雷, 丁瑞军. 红外焦平面列级ADC数字读出电路测试技术研究[J]. 红外与激光工程, 2020, 49(4): 0404004. Yiqun Cen, Junling Zhang, Honglei Chen, Ruijun Ding. Research on testing technology of column-level ADC in IRFPA digital readout circuits[J]. Infrared and Laser Engineering, 2020, 49(4): 0404004.

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