Chinese Optics Letters, 2021, 19 (3): 031101, Published Online: Feb. 25, 2021  

Reflectance transformation imaging of 3D detection for subtle traces Download: 788次

Author Affiliations
1 Laboratory of Information Optics and Optoelectronic Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
2 Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
Abstract
This paper reports a detection method of two-dimensional (2D) enhancement and three-dimensional (3D) reconstruction for subtle traces with reflectance transformation imaging, which can effectively locate the trace area of interest and extract the normal data of this area directly. In millimeter- and micron-scale traces, during 3D construction, we presented a method of data screening, conversion, and amplification, which can successfully suppress noise, improve surface and edge quality, and enhance 3D effect and contrast. The method not only captures 2D and 3D morphologies of traces clearly but also obtains the sizes of these traces.

Jie Dai, Lihua Huang, Kai Guo, Liqing Ling, Huijie Huang. Reflectance transformation imaging of 3D detection for subtle traces[J]. Chinese Optics Letters, 2021, 19(3): 031101.

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