首页 > 论文 > Chinese Optics Letters > 17卷 > 12期(p:121103)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

  • 摘要
  • 论文信息
  • 参考文献
  • 被引情况
  • PDF全文
分享:

Abstract

Subtractive imaging is used to suppress the axial sidelobes and improve the axial resolution of 4pi microscopy with a higher-order radially polarized (RP) Laguerre–Gaussian (LG) beam. A solid-shaped point spread function (PSF) and a doughnut-shaped PSF with a dark spot along the optical axis are generated by tightly focusing a higher-order RP-LG beam and a modulated circularly polarized beam, respectively. By subtracting the two images obtained with those two different PSFs, the axial sidelobes of the subtracted PSF are reduced from 37% to about 10% of the main lobe, and the axial resolution is increased from 0.21λ to 0.15λ.

Newport宣传-MKS新实验室计划
补充资料

DOI:10.3788/COL201917.121103

所属栏目:Imaging Systems

基金项目:This work was supported by the Key Program of the Natural Science Foundation of Tianjin (No. 19JCZDJC32700) and the Science and Technology Support Program of Tianjin (No. 17YFZCSY00740). This work was partially carried out at the Engineering Research Center of Thin Film Photo-electronics Technology, Ministry of Education.

收稿日期:2019-06-17

录用日期:2019-08-22

网络出版日期:2019-12-03

作者单位    点击查看

Zhiyuan Gu:Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Xianghui Wang:Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Jianxin Wang:Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Fei Fan:Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
Shengjiang Chang:Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China

联系人作者:Xianghui Wang(wangxianghui@nankai.edu.cn)

备注:This work was supported by the Key Program of the Natural Science Foundation of Tianjin (No. 19JCZDJC32700) and the Science and Technology Support Program of Tianjin (No. 17YFZCSY00740). This work was partially carried out at the Engineering Research Center of Thin Film Photo-electronics Technology, Ministry of Education.

【1】W. Volker and S. W. Hell. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Phys. Rev. Lett. 94, (2005).

【2】S. W. HellS. W. Hell. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Nat. Methods. 6, (2009).

【3】S. Quabis, R. Dorn, M. Eberler, O. Gl?ckl and G. Leuchs. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Commun. 179, (2000).

【4】R. Dorn, S. Quabis and G. Leuchs. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Phys. Rev. Lett. 91, (2003).

【5】Q. ZhanQ. Zhan. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 12, (2004).

【6】L. Novotny, M. R. Beversluis, K. S. Youngworth and T. G. Brown. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Phys. Rev. Lett. 86, (2001).

【7】M. Matthias, V. Romano and T. Feurer. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Appl. Phys. A. 86, (2007).

【8】Y. Kozawa and S. Shunichi. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 27, (2010).

【9】M. Yoshida, Y. Kozawa and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Lett. 44, (2019).

【10】Y. Kozawa and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 29, (2012).

【11】Y. Kozawa and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 24, (2007).

【12】Y. Kozawa, T. Hibi, A. Sato, H. Horanai, M. Kurihara, N. Hashimoto, H. Yokoyama, T. Nemoto and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 19, (2011).

【13】Y. Kozawa and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 23, (2015).

【14】G. Chen, F. Song and H. Wang. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Lett. 38, (2013).

【15】S. Hell and E. H. K. Stelzer. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 9, (1992).

【16】M. Nagorni and S. W. Hell. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 18, (2001).

【17】S. Hell and E. H. K. Stelzer. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Commun. 93, (1992).

【18】S. Hell, W. S. Lindek and E. H. K. Stelzer. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Mod. Opt. 41, (1994).

【19】M. Schrader, S. W. Hell and H. T. M. van der Voort. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Appl. Phys. 84, (1998).

【20】M. Mart?nez-Corral, A. Pons and M. T. Caballero. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 19, (2002).

【21】M. Mart?nez-Corral, M. T. Caballero, A. Pons and P. Andrés. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Micron. 34, (2003).

【22】S. J. Hewlett and T. Wilson. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Mach. Vis. Appl. 4, (1991).

【23】S. Segawa, Y. Kozawa and S. Sato. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Lett. 39, (2014).

【24】Y. Zhang, L. Kong, H. Xie, X. Han and Q. Dai. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 26, (2018).

【25】S. Deng, Y. Xiao, J. Hu, J. Chen, Y. Wang and M. Liu. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Chin. Opt. Lett. 16, (2018).S. Deng, Y. Xiao, J. Hu, J. Chen, Y. Wang and M. Liu. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Chin. Opt. Lett. 16, (2018).

【26】H. Jia, X. Yu, Y. Yang, X. Zhou, S. Yan, C. Liu, M. Lei and B. Yao. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Biophoton. 12, (2019).

【27】B. Richards and E. Wolf. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Proc. R. Soc. Lond. A Math. Phys. Sci. 253, (1959).

【28】K. S. Youngworth and T. G. Brown. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 7, (2000).

【29】G. Zhao, C. Kuang, Z. Ding and X. Liu. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. Opt. Express. 24, (2016).

【30】S. Kimura and C. Munakata. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. Soc. Am. A. 6, (1989).

【31】X. Hao, C. Kuang, T. Wang and X. Liu. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Opt. 12, (2010).

【32】S. Liu, S. You, Y. Fang, Y. Wang, C. Kuang and X. Liu. Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging. J. Mod. Opt. 63, (2016).

引用该论文

Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang, "Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging," Chinese Optics Letters 17(12), 121103 (2019)

您的浏览器不支持PDF插件,请使用最新的(Chrome/Fire Fox等)浏览器.或者您还可以点击此处下载该论文PDF