[1] 支婷婷,黄奎喜,林尊琪,等.激光远场CCD诊断仪[J].激光与光电子学进展,1997,(4):29-35(Zhi T T,Huang K X,Lin Z Q,et al.Laser far field CCD diagnostic device.Laser and Optoelectronics Progress,1997,(4):29-35)

[2] 李强,雷訇,左铁钏.大功率激光强度分布测量系统[J].电子测量技术,2000,(1):11-13.(Li Q,Lei H,Zuo T C.Measuring system for high power laser transverse intensity distribution.Electronic Measurement Technology,2000,(1):11-13)

[3] 冯国英,吕百达,孔繁龙,等.用二维CCD系统测量光束质量的实验研究[J].强激光与粒子束,1997,9(4):491.(Feng G Y,Lü B D,Kong F L,et al.Experimental study of beam quality using two-dimensional CCD system.High Power Laser and Particle Beams,1997,9(4):491)

[4] 杨家敏,丁耀南,曹磊峰,等.X光CCD响应特性[J].强激光与粒子束,2000,12(5):565-568.(Yang J M,Ding Y N,Cao L F,et al.Study on response of X-ray charge coupled device to soft-X-ray.High Power Laser and Particle Beams,2000,12(5):565-568)

[5] 谢旭东,陈波,刘华,等.CCD系统线性动态范围的标定[J].强激光与粒子束,2000,12(s1):182-184.(Xie X D,Chen B,Liu H,et al.Calibration of linear dynamic range for CCD system.High Power Laser and Particle Beams,2000,12(s1):182-184)

[6] 王淑青,段海峰,杨泽平,等.双缝衍射用于CCD响应特性标定的模拟研究[J].光电工程,2002,28(4):19-21.(Wang S Q,Duan H F,Yang Z P,et al.Simulation of diffraction by a double slit to measure CCD input-output responsivity.Opto-Electronic Engineering,2002,28(4):19-21)

[7] 王成程,郑万国,於海武,等.大口径方光束片状放大器小信号增益实验研究[J].强激光与粒子束,2000,12(2):155-158.(Wang C C,Zhen W G,Yu H W,et al.Research of small signal gain character in laser aperture square beam slab amplifiers.High Power Laser and Particle Beams,2000,12(2):155-158)

[8] 阮秋琦.数字图像处理学[M].北京:电子工业出版社,2001.(Ruan Q Q.Digital image processing.Beijing:Publishing House of Electronics Industry,2001)

[9] Leng H Y,Dai J Z.A study of an applied sub-pixel positioning algorithm[J].Infrared and Laser Engineering,2001,1(1):48-52.