不同基底上SiO2薄膜红外波段的水吸收特性
[1] Kintaka K, Nishi J, Mizutani A, et al.. Ntireflection microstructures fabricated upon fluorine-doped SiO2 films[J]. Opt Lett, 2001, 26(21): 1642-1644.
[2] Zhao Y A, Wang T, Zhang D W, et al.. Laser conditioning and multi-shot laser damage accumulation effects of HfO2/SiO2 antireflective coatings[J]. Appl Surf Sci, 2005, 245(1): 335-339.
[3] Pinard L, Sassolas B, Flaminio R, et al.. Toward a new generation of low-loss mirrors for the advanced gravitational waves interferometers[J]. Opt Lett, 2011, 36(8): 1407-1409.
[4] Chand N, Johnson J E, Osenbach J W, et al.. Molecular-beam deposition of high-quality silicon-oxide dielectric films[J]. J Cryst Growth, 1995, 148(4): 336-344.
[5] Nakata S, Kato T, Ozaki S, et al.. Improvement of charge trapping characteristics of Al2O3/Al-rich Al2O3/SiO2 stacked films by thermal annealing[J]. Thin Solid Films, 2013, 542: 242-245.
[6] Huang J, Zeng Y, Wang W, et al.. Reduction of residual stress in SiO2-matrix silicon nano-crystal thin films by a combination of rapid thermal annealing and tube-furnace annealing[J]. Physic Status Solid Applications and Materials Science, 2013, 210(3): 528-532.
[7] Ha T, Park H, Jang H, et al.. Study on the thermal stability of ordered mesoporous SiO2 film for thermal insulating film[J]. J Cryst Growth, 2012, 158: 123-128.
[8] Zhang Q, Yoon S F, Zhgoon S, et al.. Study of diamond-like carbon films on LiNbO3[J]. Thin Solid Films, 2000, 360(1-2): 274-277.
[9] Boudjemaa A, Daniel C, Mirodatos C, et al.. In situ DRIFTS studies of high-temperature water-gas shift reaction on chromium-free iron oxide catalysts[J]. Comptes Rendus Chimie, 2011, 14(6): 534-538.
[10] Abe J, Hirano N, Tsuchiya N. Infrared spectroscopic study of water in mesoporous silica under supercritical conditions[J]. J Mater Sci, 2012, 47(23): 7971-7977.
[11] Hu G, Zhu L, Jia A, et al.. In situ real-time diffuse reflection infrared fourier transform spectroscopy (DRIFTS) study of hydrogen adsorption and desorption on Ir/SiO2 catalyst[J]. Applied Spectroscopy, 2012, 66(5): 600-605.
[12] 王河, 贺洪波, 张伟丽. 不同基底SiO2薄膜的显微结构和力学性能[J]. 无机材料学报, 2013, 28(6): 653-658.
Wang He, He Hongbo, Zhang Weili. Substrate effects on the microstructure and mechanical properties of SiO2 thin films[J]. J Inorganic Materials, 2013, 28(6): 653-658.
[13] Richard T, Mercury L, Poulet F, et al.. Diffuse reflectance infrared Fourier transform spectroscopy as a tool to characterise water in adsorption/confinement situations[J]. Journal of Colloid and Interface Science, 2006, 304(1): 125-136.
李豪, 易葵, 崔云, 范正修. 不同基底上SiO2薄膜红外波段的水吸收特性[J]. 中国激光, 2014, 41(7): 0707001. Li Hao, Yi Kui, Cui Yun, Fan Zhengxiu. Substrate Effects on the Water Absorption of Infrared SiO2 Film[J]. Chinese Journal of Lasers, 2014, 41(7): 0707001.