In this paper, we have demonstrated significant electric field induced (EFI) optical rectification (OR) effects existing in the surface layers of germanium (Ge), and measured the distributions of EFI OR signals along the normal directions of surface layers of Ge samples. Based on the experimental results, the ratios of the two effective second-order susceptibility componentsχ_zzz^((2eff))/χ_zxx^((2eff)) for Ge(001) , Ge(110) and Ge(111) surface layers can be estimated to be about 0.92, 0.91, and 1.07, respectively. The results indicated that the EFI OR can be used for analyzing the properties on surface layers of Ge, which has potential applications in Ge photonics and optoelectronics.
Zhang Li, Li Fangye, Wang Shuai, Wang Qi, Luan Kairan, Chen Xi, liu xiuhuan, Qiu Lingying, Chen Zhanguo, Zhao Ji-Hong, Hou Lixin, Gao Yanjun, jia Gang. Research of optical rectification in surface layers of germanium[J]. Chinese Optics Letters, 2018, 16(10): .
