Analysis and Testing of Total Ionizing Dose Effect on Several Commercial Optical Transceivers via Gamma-Ray Radiation
In our paper, we selected several commercial optical transceivers, which consist of single-channel transceiver modules, parallel transmitting and receiving modules, and EPON OLT and ONU modules, to do the total ionizing dose (TID) testing via gamma-ray radiation method. The changing of current and receiver sensitivity of optical transceivers are discussed and analyzed. Based on the TID testing exposed to a total ionizing dose of 50 krad (Si) at a dose rate of about 0.1 rad (Si)/s, the performance of single-channel transceivers and parallel receiving modules have not changed after 50 krad (Si) exposed, the parallel transmitting and EPON ONU modules have not worked after 40 krad (Si) and 47 krad (Si) exposed, the EPON OLT module has bit error in the process of irradiation and it can work well after annealing, and the reason for the error of OLT is analyzed. Finally, based on the theoretical analyzed and testing results, this paper provides several design suggestions to improve the reliability for optical transceivers, which can be referenced by satellite system designation for various space missions.
作者单位：AVIC Hisense Photoelectric Technology Co., Ltd,
Zhan Yueying,He Jianhua,Wang Fei,Wang Liqian. Analysis and Testing of Total Ionizing Dose Effect on Several Commercial Optical Transceivers via Gamma-Ray Radiation[J].Chinese Optics Letters,2019,17(5):05.