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Electron Beam-induced Degradation of Halide Perovskite-related Semiconductor Nanomaterials [Early Posting]

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摘要

The instability of lead halide perovskites in various application-related conditions is a key challenge to be resolved. We investigated the formation of metal nanoparticles during transmission electron microscopy (TEM) imaging of perovskite-related metal halide compounds. The metal nanoparticle formation on these materials originates from stimulated desorption of halogen under electron beam, and a subsequent aggregation of metal atoms. Based on shared mechanism, the TEM-based degradation test can help to evaluate the material stability against light irradiation.

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作者单位:

    Sun Yat-Sen University
    Sun Yat-Sen University
    National University of Singapore
    Istituto Italiano di Tecnologia
    Sun Yat-Sen University

引用该论文

Dang Zhiya,Luo Yuqing,Wang Xue-Sen,Imran Muhammad,Gao Pingqi. Electron Beam-induced Degradation of Halide Perovskite-related Semiconductor Nanomaterials[J].Chinese Optics Letters,2021,19(3):03.