光学学报, 2020, 40 (14): 1424001, 网络出版: 2020-07-23   

工字形椭圆纳米结构的吸收及其折射率敏感特性研究 下载: 1069次

Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures
作者单位
1 中北大学仪器与电子学院, 山西, 太原 030051
2 中北大学电子测试技术国防科技重点实验室, 山西, 太原 030051
3 北京宇航系统工程研究院, 北京 100000
摘要
设计了一个由金纳米结构顶层、中间介质层和金属基底层构成的复合超材料结构。其中,金属纳米结构顶层是由三个椭圆形纳米盘所组成的“工”字形单元阵列,中间介质层是二氧化硅,金属基底层是金膜。利用有限元方法研究了该结构的吸收特性、电场分布及折射率传感特性。结果表明:该结构的吸收光谱中出现了三个吸收峰,其吸收率分别达到91.06%、99.63%和97.26%。此外,研究了结构参数和周围环境介质对吸收率的影响及其折射率变化的响应特性,折射率灵敏度最大达到425 nm/RIU(RIU为单位折射率),品质因数(FOM)为14。这些研究将为基于表面等离激元超材料结构的完美吸收器用作折射率传感器提供理论指导。
Abstract
In this study, a composite metamaterial structure comprising a gold-nanostructure top layer, an intermediate dielectric layer, and a metal base layer was proposed. An I-shaped cell array comprising three oval nanodisks is the top layer of the metamaterial nanostructure, silicon dioxide is the intermediate dielectric layer, and a gold film is the metal base layer. Herein, the absorption characteristics, electric field distribution, and refractive index sensitivity characteristics of the structure were studied via the finite element method. Thus, three absorption peaks can be observed, and the corresponding absorptions are observed to be 91.06%, 99.63%, and 97.26%. In addition, the influence of the structural parameters and surrounding media on the absorption and response characteristics with respect to the changes in the refractive index was studied. The maximum sensitivity is 425 nm/RIU (RIU is the refractive index unit), and the figure of merit is 14. This study would provide theoretical guidance for developing perfect absorbers by considering the surface plasmon metamaterial structure as a refractive index sensor.

旷依琴, 李刚, 闫竹青, 张彦军, 张志东, 郝现伟. 工字形椭圆纳米结构的吸收及其折射率敏感特性研究[J]. 光学学报, 2020, 40(14): 1424001. Yiqin Kuang, Gang Li, Zhuqing Yan, Yanjun Zhang, Zhidong Zhang, Xianwei Hao. Absorption and Refractive Index Sensitivity of the I-Shaped Elliptical Nanostructures[J]. Acta Optica Sinica, 2020, 40(14): 1424001.

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