为降低探测器的热噪声和暗电流,研制了一套高精度和高稳定度科学级裸片探测器制冷系统。提出了一种基于低温循环机和薄膜电加热器组合的探测器控温方法,减小了测试光源及环境温度变化对器件自身性能的影响。实验结果表明,探测器制冷系统降温速率不大于0.6 ℃/min,控温精度优于±0.08 ℃,将该制冷系统应用于多角度偏振成像仪面阵探测器的光电性能测试,测试结果表明:探测器工作温度升高6.5 ℃,暗电流增加1倍左右,20 ℃时暗电流是0 ℃时的6.93倍。近红外波段的量子效率受温度影响较大,810 nm和900 nm波段在0~15 ℃工作区间内量子效率的温度变化率为0.2993% ℃ ^-1和0.4575% ℃ ^-1。探测器暗电流和光谱响应度的温度特性研究为多角度偏振成像仪在轨辐射定标的温度校正提供了依据。

In this work, a high-precision, high-stability refrigeration system for a scientific-grade bare CCD detector was developed to reduce the thermal noise and dark current of the detectors. A temperature control method for the detector comprising a low-temperature circulator and a thin-film electric heater was proposed, which could reduce the influence of the test light source and environmental temperature change on device performance. Experiment results reveal that the cooling rate of the refrigeration system is less than 0.6 ℃/min and the temperature control accuracy is better than ±0.08 ℃. The refrigeration system was applied to the electro-optical performance test of an array detector for a directional polarimetric camera (DPC). The results revealed that the working temperature increased by 6.5 ℃, the dark current increased approximately 1-fold, and the dark current at 20 ℃ was approximately 6.93 times that at 0 ℃. The quantum efficiency in the near-infrared band was considerably affected by temperature. The change rates of temperature-induced quantum efficiency in the working range of 0--15 ℃ at the 810- and 900-nm bands are 0.2993% ℃ ^-1 and 0.4575% ℃ ^-1, respectively. The study of the temperature characteristics of the detector dark current and spectral responsivity provides a basis for the temperature correction of the in-orbit radiation calibration of the DPC.