激光与光电子学进展, 2019, 56 (2): 021201, 网络出版: 2019-08-01  

高精瞄具重复装卡误差测量 下载: 815次

Repeated Loading Error Measurement of High-Precision Optical Sight
作者单位
1 吉林东光精密机械厂, 吉林 长春 130021
2 长春理工大学光电工程学院, 吉林 长春 130022
3 陆军装甲兵军事代表局驻长春地区军事代表室, 吉林 长春 130023
摘要
零位走动量是衡量瞄具稳定性的重要指标之一。由于普通瞄具对零位走动量要求较低,在测量其零位走动量时往往忽略了瞄具的重复装卡误差对零位走动量的影响,但在高精度瞄具的零位走动量的测量中,重复装卡误差是不能忽略的。基于自准直仪原理,设计了一套自动消除重复装卡误差的装置。该装置由半反半透镜的自动贴合装置及光电自准直仪组成。以压力传感器配合压电陶瓷(PZT)微位移器件形成一个微动微调闭环反馈系统,实现对半反半透镜姿态的实时调整,确保半反半透镜与瞄具物镜的端面完全贴合。经实验验证,该装置在5°测量范围内可达到2″的测量精度,足以满足对高精瞄具零位重复装卡误差的测量要求。
Abstract
Zero walking amount is one of the important indicators to evaluate the stability of sight. However, when the zero walking amount is measured, the influence of the repeated loading error of sight on the zero walking amount is usually neglected, because the ordinary sight has a low requirement of zero walking. In contrast, in the zero walking amount measurement of a high-precision sight, the repeated loading error cannot be ignored. Based on the principle of self-collimator, a device for automatically eliminating the repeated loading errors is designed, which consists of an automatic laminating device with a semi-reflecting and semi-transmitting and an electro-optical autocollimator. In addition, a pressure sensor is combined with a piezoelectric ceramic transducer (PZT) micro-displacement device to form a micro-motion fine-tuning closed-loop feedback system and the real-time adjustment of the pose of the semi-reflecting and semi-transmitting is realized. Thus the semi-reflecting and semi-transmitting and the end surface of the objective lens are completely fitted. It has been verified by experiments that the device can be used to achieve a measurement accuracy of 2" in the 5° measurement range, which is sufficient to meet the measurement requirements of zero-level reloading errors for a high-precision sight.

徐志刚, 赵媛媛, 周亮. 高精瞄具重复装卡误差测量[J]. 激光与光电子学进展, 2019, 56(2): 021201. Zhigang Xu, Yuanyuan Zhao, Liang Zhou. Repeated Loading Error Measurement of High-Precision Optical Sight[J]. Laser & Optoelectronics Progress, 2019, 56(2): 021201.

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