激光与光电子学进展, 2020, 57 (23): 231203, 网络出版: 2020-12-10
基于VCSEL结电压的自混合干涉位移测量 下载: 861次
Self-Mixing Interference Displacement Measurement Based on Vertical-Cavity Surface-Emitting Laser Junction Voltage
测量 自混合干涉 垂直腔面发射激光器 结电压 传感技术 measurement self-mixing interference vertical-cavity surface-emitting laser junction voltage sensing technology
摘要
研究了一种新的基于激光器结电压测量的自混合干涉传感技术,通过测量激光二极管结电压的变化来获得激光自混合干涉信号。传统的自混合干涉技术通常通过测量外置或内置光电探测器的光电流来获得激光自混合干涉信号。本文通过测量垂直腔面发射激光器的PN结电压来获得激光自混合干涉信号,简化了自混合干涉系统的结构并提高了系统的可靠性。本文还评估了该系统的信噪比,比较了激光二极管的结电压信号与内置光电探测器的光电流信号,结果发现两者一致。
Abstract
This paper studied a new self-mixing interference (SMI) sensing technology based on the measurement of laser diode junction voltage. The SMI signal was obtained by measuring the variation of laser diode junction voltage. Conventional SMI technology usually employs a detection scheme that utilizes the photocurrent from an external or integrated photodiode (PD) to obtain the SMI signal. In this paper, the SMI signal was obtained by measuring the PN junction voltage of a vertical-cavity surface-emitting laser(VCSEL), which simplifies the structure of the SMI system and improves the system reliability. The signal-to-noise ratio of the system were evaluated, and the junction voltage signal of the laser diode was compared with the photocurrent signal of integrated PD, the results were found to be consistent.
夏梵华, 王慧鹏, 夏巍, 郝辉, 郭冬梅, 王鸣. 基于VCSEL结电压的自混合干涉位移测量[J]. 激光与光电子学进展, 2020, 57(23): 231203. Fanhua Xia, Huipeng Wang, Wei Xia, Hui Hao, Dongmei Guo, Ming Wang. Self-Mixing Interference Displacement Measurement Based on Vertical-Cavity Surface-Emitting Laser Junction Voltage[J]. Laser & Optoelectronics Progress, 2020, 57(23): 231203.