激光与光电子学进展, 2020, 57 (23): 231203, 网络出版: 2020-12-10  

基于VCSEL结电压的自混合干涉位移测量 下载: 861次

Self-Mixing Interference Displacement Measurement Based on Vertical-Cavity Surface-Emitting Laser Junction Voltage
作者单位
南京师范大学物理科学与技术学院,江苏省光电技术重点实验室,江苏 南京 210023
摘要
研究了一种新的基于激光器结电压测量的自混合干涉传感技术,通过测量激光二极管结电压的变化来获得激光自混合干涉信号。传统的自混合干涉技术通常通过测量外置或内置光电探测器的光电流来获得激光自混合干涉信号。本文通过测量垂直腔面发射激光器的PN结电压来获得激光自混合干涉信号,简化了自混合干涉系统的结构并提高了系统的可靠性。本文还评估了该系统的信噪比,比较了激光二极管的结电压信号与内置光电探测器的光电流信号,结果发现两者一致。
Abstract
This paper studied a new self-mixing interference (SMI) sensing technology based on the measurement of laser diode junction voltage. The SMI signal was obtained by measuring the variation of laser diode junction voltage. Conventional SMI technology usually employs a detection scheme that utilizes the photocurrent from an external or integrated photodiode (PD) to obtain the SMI signal. In this paper, the SMI signal was obtained by measuring the PN junction voltage of a vertical-cavity surface-emitting laser(VCSEL), which simplifies the structure of the SMI system and improves the system reliability. The signal-to-noise ratio of the system were evaluated, and the junction voltage signal of the laser diode was compared with the photocurrent signal of integrated PD, the results were found to be consistent.

夏梵华, 王慧鹏, 夏巍, 郝辉, 郭冬梅, 王鸣. 基于VCSEL结电压的自混合干涉位移测量[J]. 激光与光电子学进展, 2020, 57(23): 231203. Fanhua Xia, Huipeng Wang, Wei Xia, Hui Hao, Dongmei Guo, Ming Wang. Self-Mixing Interference Displacement Measurement Based on Vertical-Cavity Surface-Emitting Laser Junction Voltage[J]. Laser & Optoelectronics Progress, 2020, 57(23): 231203.

引用该论文: TXT   |   EndNote

相关论文

加载中...

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!