中国激光, 1987, 14 (3): 167, 网络出版: 2012-08-10
半导体激光器谱宽的测量研究
Measurement of spectral linewidth of semiconductor lasers
摘要
本文从范德玻尔(van der Pol)方程出发,导出了描述延迟自差拍法谱宽测量的公式。讨论了各结构参数对测量的影响。报道了用该法对单频半导体激光器测量的一些结果。
Abstract
Based on van der Pol equation, the paper deduces the formulas describing the measurement of spectral linewidth of semiconductor lasers with delay self-heterodyne method, and discusses the influence of the spectral parameters on the measurement.Also reported are some measurement results on single frequency semiconductor lasers.
杜筱诚, 何震川, 唐树兰. 半导体激光器谱宽的测量研究[J]. 中国激光, 1987, 14(3): 167. Du Xiaocfiehg, He Zhengchuan, Tang Sulan. Measurement of spectral linewidth of semiconductor lasers[J]. Chinese Journal of Lasers, 1987, 14(3): 167.
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