[1] . Fourier transform profilometry for the automatic measurement of 3-D object shapes[J]. Appl. Opt., 1983, 22(24): 3977-3982.

[2] . Srinivasan, H. C. Liu, M. Halioua. Automated phase-measuring profilometry of 3-D diffuse objects[J]. Appl. Opt., 1984, 23(18): 3105-3108.

[3] . Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry[J]. J. Opt. Soc. Am., 1982, 72(1): 156-160.

[4] . . Removal of carrier frequency in phase-shifting techniques[J]. Optics and Lasers in Engineering, 1998, 30(1): 107-115.

[5] . Carrier phase component removal: a generalized least-squares approach[J]. J. Opt. Soc. Am. A, 2006, 23(2): 435-443.

[6] . Quan, C. J. Tay, L. J. Chen. A study on carrier-removal techniques in fringe projection profilometry[J]. Optics & Laser Technology, 2007, 39(6): 1155-1161.

[7] 侯溪, 伍凡, 杨力 等. 中心遮拦干涉图的圆泽尼克拟合对计算赛德尔像差的影响分析［J］. 光学学报, 2006, 26(1): 54～60

    Hou Xi, Wu Fan, Yang Li et al.. Effect of central obscuration interferograms fitted with Zernike circle polynomials on calculating Seidel aberrations ［J］. Acta Optica Sinaca, 2006, 26(1): 54～60

[8] 唐玉科, 何小海, 陶青川. 基于泽尼克多项式的显微镜点扩展函数研究［J］. 光学学报, 2009, 29(1): 169～175

    Tang Yuke, He Xiaohai, Tao Qingchuan. Research on the point spread function of microscope based on the Zernike polynomials ［J］. Acta Optica Sinaca, 2009, 29(1): 169～175

[9] James C. Wyant. Applied Optics and Optical Engineering, Vol. XI ［M］. Riverport: Academic Press, 1992

[10] . 应用泽尼克多项式自由曲面的成像物镜设计[J]. 浙江大学学报(工学版), 2008, 42(12): 2202-2206.

    . . Design of reflective lens with Zernike polynomial free form surfaces[J]. J. Zhejiang University (Engineering Science), 2008, 42(12): 2202-2206.

[11] 江旻珊, 周传清, 任秋实. 两种可变形反射镜泽尼克系数的生成误差分析［J］. 光学学报, 2009, 29(s1): 396～398

    Jiang Minshan, Zhou Chuanqing, Ren Qiushi. Zernike generation analysis of two deformable mirrors ［J］. Acta Optica Sinaca, 2009, 29(s1): 396～398

[12] 叶红卫, 李新阳, 鲜浩 等. 光学系统的Zernike像差与光束质量β因子的关系［J］. 中国激光, 2009, 36(6): 1420～1427

    Ye Hongwei, Li Xinyang, Xian Hao et al.. Relationship between Zernike wavefront errors and beam quality factor β for optics system ［J］. Chinese J. Lasers, 2009, 36(6): 1420～1427

[13] . 用Zernike自由曲面设计弯曲屏幕超薄投影系统[J]. 浙江大学学报(工学版), 2009, 43(8): 1428-1432.

    . . Design of ultra-thin projection system with curved screen based on Zernike free-form surfaces[J]. J. Zhejiang University (Engineering Science), 2009, 43(8): 1428-1432.

[14] 莫卫东. 数字平面检测系统误差和精度评价方法的研究［J］. 光学学报, 2003, 23(7): 879～883

    Mo Weidong. Error and precision evaluation of a system for inspecting surface of optical plane ［J］. Acta Optica Sinaca, 2003, 23(7): 879～883

[15] 刘元坤, 苏显渝, 吴庆阳. 基于傅里叶条纹分析的多摄像机标定方法［J］. 光子学报, 2007, 36(9): 1734～1737

    Liu Yuankun, Su Xianyu, Wu Qingyang. Multi-camera calibration by FTP technique ［J］. Acta Photonica Sinica, 2007, 36(9): 1734～1737