[1] zuysal M, Calonder M, Lepetit V, et al. Fast keypoint recognition using random ferns［J］. IEEE Trans on Pattern Anal Mach Intell, 2010, 32(3):448-461.

[2] Mikolajczyk K, Tuytelaars T, Schmid C, et al. A comparison of affine region detectors［J］.International Journal of Computer Vision,2005,65(1):43-72.

[3] Mikolajczyk K, Schmid C. A performance evaluation of local descriptors［J］.IEEE Trans on Pattern Anal Mach Intell,2005,27(10):1615-1630.

[4] Shi J, Tomasi C. Good features to track［C］//IEEE Conference on Computer Vision and Pattern Recognition.1994:593-600.

[5] Lowe D G. Distinctive image features from scale-invariant keypoints［J］.International Journal of Computer Vision,2004,60(2): 91-110.

[6] Bay H, Ess A, Tuytelaars T, et al. SURF: Speeded up robust features［J］.Computer Vision and Image Understanding,2008,110(3):346-359.

[7] Rosten E, Porter R, Drummond T. Faster and better: A machine learning approach to corner detection［J］.IEEE Trans on Pattern Anal Mach Intell,2010,32(1):105-119.

[8] Calonder M, Lepetit V, Strecha C, et al. BRIEF: Binary robust independent elementary features［C］//The 11th European Conference on Computer Vision. 2010.

[9] Fischler M A, Rolles R C. Random sample consensus: A paradigm for model fitting with applications to image analysis and automated cartography［J］.Commun ACM,1981,24(6):381-395.

[10] Rousseeuw P J, Leroy A. Robust regression and outlier detection［M］. New York: John Wiley and Sons, 1987.

[11] Hartley R I, Zisserman A. Multiple view geometry in computer vision［M］. Cambridge: Cambridge University Press, 2004.