拟合阶次对基于多项式拟合的相位—高度映射关系的影响
万安军, 赵勋杰. 拟合阶次对基于多项式拟合的相位—高度映射关系的影响[J]. 光电技术应用, 2018, 33(3): 29.
WAN An-jun, ZHAO Xun-jie. Effect of Fitting Order on Phase-height Mapping Based on Polynomial Fitting[J]. Electro-Optic Technology Application, 2018, 33(3): 29.
[1] Porras-Aguilar R, Falaggis K. Absolute phase recovery in structured light illumination systems: Sinusoidal vs. intensity discrete patterns [J]. Optics and Lasers in Engineering, 2016, 84:111-119.
[2] 张佰春. 条纹投影三维测量的若干关键技术的研究[D]. 深圳大学, 2017.
[3] Zuo C, Huang L, Zhang M, et al. Temporal phase unwrapping algorithms for fringe projection profilometry: A comparative review [J]. Optics and Lasers in Engineering, 2016, 85:84-103.
[4] Xiao Y, Cao Y, Wu Y. Improved algorithm for phase-to-height mapping in phase measuring profilometry [J]. Optical Society of America, 2012, 51(8):1149-1155.
[5] Rao L, Da F, Kong W, et al. Flexible calibration method for telecentric fringe projection profilometry systems [J]. Optics Express, 2016, 24(2):1222-1237.
[6] Wang Z, Liu M, Yang S, et al. Precise full-field distortion rectification and evaluation method for a digital projector [J]. 2016, 23(5):1-7.
[7] Léandry I, Brèque C, Valle V. Calibration of a structured-light projection system: development to large dimension objects [J]. Optics and Lasers in Engineering, 2012, 50(3):373-379.
[8] 刘顺涛, 骆华芬, 陈雪梅, 等. 结构光测量系统的标定方法综述[J]. 激光技术, 2015(02):252-258.
[9] Li X, Zhang Z, Yang C. Reconstruction method for fringe projection profilometry based on light beams [J]. Appl Opt, 2016, 55(34):9895-9906.
[10] Xu Y, Wang Y, Ji Y, et al. Three-frame generalized phase-shifting interferometry by a Euclidean matrix norm algorithm [J]. Optics and Lasers in Engineering, 2016, 84:89-95.
[11] 符红. 结构光投影三维轮廓测量系统的标定[D]. 浙江大学, 2013.
[12] Huang J, Wu Q. A new reconstruction method based on fringe projection of three-dimensional measuring system [J]. Optics and Lasers in Engineering, 2014, 52:115-122.
万安军, 赵勋杰. 拟合阶次对基于多项式拟合的相位—高度映射关系的影响[J]. 光电技术应用, 2018, 33(3): 29. WAN An-jun, ZHAO Xun-jie. Effect of Fitting Order on Phase-height Mapping Based on Polynomial Fitting[J]. Electro-Optic Technology Application, 2018, 33(3): 29.