馆藏丝绢文物具有极高的历史价值和艺术价值, 但是丝绢材料却极易在展陈照明过程中发生开裂和脆化。 由于红紫外光对于文物照明没有贡献, 因此实现丝绢文物有效照明保护的基础, 是找到评价可见光对于丝绢材料照明损伤度的有效方法。 机械损伤是丝绢文物最主要的光化学损伤形式, 本质上是其内部的分子结构发生了改变, 而常用的色差法和拉曼光谱法均因自身局限性无法有效测取丝绢文物的微观结构。 研究表明红外光谱法适用于测取丝绢文物的微观变化, 且光谱中表征酪氨酸和结晶度的特征信号能够有效反映紫外光对于丝心蛋白结构和性质的影响, 但是两者表征可见光对于丝绢材料照明损伤度的有效性目前仍有待明确。 通过十种窄带光源的辐照实验得到了丝绢文物的光老化样品, 并基于样品的红外光谱分析定义了酪氨酸指数TFTIR和结晶度指数CFTIR两种损伤评价参数。 在使用TFTIR和CFTIR描述可见光对于丝绢样品照明损伤规律的基础上, 进一步分析了两者表征丝绢材料对可见光波长λ和曝光量Q耦合响应的性能。 对Q与TFTIR的相关性分析结果表明: 除595 nm辐照组外（Sig＜0.05）, Q对TFTIR均无显著影响（Sig>0.05）, 说明TFTIR不适合表征丝绢的光照响应度。 对Q与CFTIR的相关性分析结果表明: Q对CFTIR有显著影响（Sig＜0.01）且两者相关性很强（|Pearson|＞0.9）, 说明CFTIR能够有效表征丝绢材料对于Q的响应特性。 对Q与CFTIR的线性回归分析结果表明: 两者虽不适合建立线性回归模型（R2＜0.8）, 但Q对于CFTIR具有解释性（Sig<0.05）; λ对CFTIR的影响有差异但没有突变, 说明CFTIR具有表征丝绢材料对于λ响应特性的潜力。 根据上述分析结论, 使用多项式拟合构建了基于CFTIR的丝绢光照响应度函数f(λ, Q), 拟合评价参数表明该式具有良好的解释性（确定性系数R2>0.8, 误差平方和SSE与均方根误差RMSE均趋于0）。 最终提出了丝绢文物的照明损伤度模型D=∫780380S(λ)f(λ, Q)dλ并选取典型展陈照明光源对其进行了验证, 配对样本T检验的结果（Sig>0.05）表明该模型能够准确计算丝绢文物的照明损伤度。 该研究能够为馆藏丝绢文物的照明损伤评价、 光源损伤判定和照明标准制定提供有效的帮助。

Silk cultural relics in museum collections have high historical and artistic value, but silk materials are easy to crack and embrittle in the exhibition process. Since infrared light and ultraviolet light do not contribute to the illumination of cultural relics, the basis for effective lighting protection of silk cultural relics is to find an effective method to evaluate visible light damage to silk materials. Mechanical damage is the main photochemical damage form of silk cultural relics, which is essentially the change of its internal molecular structure. However, due to their limitations, the commonly used chromatic aberrationand Raman spectroscopy cannot effectively measure the microstructure of silk cultural. Studies have shown that infrared spectroscopy is suitable for measuring the microscopic changes of silk cultural relics, and the characteristic signals characterizing tyrosine and crystallinity in the spectrum can effectively reflect the influence of ultraviolet light on the structure and properties of silk fibroin. However, the effectiveness of the two in characterizing the damage of visible light to silk materials remains to be clarified. This study obtained the photoaged samples of silk cultural relics through irradiation experiments of ten narrow-band light sources. Two damage evaluation parameters, tyrosine index TFTIR and crystallinity index CFTIR,were defined based on the infrared spectral analysis of the samples. Based on using TFTIR and CFTIR to describe the damage law of visible light to silk samples, their performance to characterize the coupling response of silk materials to visible light wavelength λ and exposure Q was further analyzed. The results of correlation analysis between Q and TFTIR showed that, except for the 595 nm irradiation group (Sig<0.05), Q has no significant effect on TFTIR (Sig>0.05), indicating that TFTIR is not suitable for characterizing the light responsivity of silk. The results of correlation analysis between Q and CFTIR showed that, Q has a significant effect on CFTIR (Sig＜0.01). They are strongly correlated (|Pearson|＞0.9), indicating that CFTIR can effectively characterize the response characteristics of silk materials to Q. The results of linear regression analysis between Q and CFTIR showed that although they are not suitable for a linear regression model (R2<0.8), Q is explanatory for CFTIR (Sig<0.05); the effect of λ on CFTIR is different, but there is no mutation, indicating that CFTIR has the potential to characterize the response characteristics of silk materials to λ. According to the above analysis conclusions, the silk light responsivity function f(λ,Q) based on CFTIR was constructed by polynomial fitting. The fitting evaluation parameters showed the function has good interpretability (coefficient of determination R2>0.8, sum of squares due to error SSE and root mean squared error RMSE tend to 0). Finally, the lighting damage model D=∫780380S(λ)f(λ,Q)dλ of silk cultural relics was proposed, and a typical exhibition lighting source was selected to verify it. The results of paired sample T-test (Sig>0.05) indicated that the model could accurately calculate the lighting damage of silkcultural relics. This study can provide effective help for evaluating lighting damage, determining light source damage, and formulating lighting standards of silk cultural relics in museum collections.