[1] . I. Flik, C. L. Tien. Size effects on the thermal conductivities of high-Tc thin-film superconductors[J]. ASME Journal of Heat Transfer, 1990, 112: 872-881.

[2] . D. McConnell, K.E. Goodson. Thermal conduction in silicon micro-and nanostructures[J]. Annual Review of Heat Transfer, 2005, 14: 129-168.

[3] . Probing ultrafast carrier and phonon dynamics in semiconducors[J]. Appl. Phys. Rev., 1998, 83(4): 1789-1830.

[4] 李成斌,贾天卿, 孙海轶 等. 飞秒激光对高反膜的破坏及其超快动力学过程[J]. 光学学报, 2006, 26(3):458～462

    Li Chengbin, Jia Tianqing, Sun Haiyi et al.. Femtosecond laser-induced damage and ultrafast dynamics in high reflection coating [J]. Acta Optica Sinica, 2006, 26(3):458～462

[5] 徐世珍,贾天卿,孙海轶 等. 飞秒激光作用下透明介质材料的反射率演化[J]. 中国激光, 2006, 33(1):53～56

    Xu Shizhen, Jia Tianqing, Sun Haiyi et al.. Time-resolved reflectivity evolution of transparent dielectrics under femtosecond-laser pulse excitation [J]. Chinese J. Lasers, 2006, 33(1):53～56

[6] 李晓溪,贾天卿,冯东海 等. 超短脉冲辐照下氟化锂的烧蚀机理及其超快动力学研究[J]. 光学学报, 2005, 25(11):1526～130

    Li Xiaoxi, Jia Tianqing, Feng Donghai et al.. The ablation mechanism and ultrafast dynamics property of lithium fluoride with the ultra-short pulse laser [J]. Acta Optica Sinica, 2005, 25(11):1526～1530

[7] Edward D. Palik. Handbook of Optical Constants of Solids [M]. London: Academic Press Inc.(London) LTD., 1985

[8] . Ultrafast dynamics in phosphorus-implanted silicon wafers: The effects of annealing[J]. Phys. Rev. B, 2002, 66(8): 085206.

[9] . Subpicosecond surface-restricted carrier and thermal dynamics by transient reflectivity measurements[J]. J. Appl. Phys., 1997, 82(8): 4033-4038.

[10] Jagdeep Shah. Ultrafast Spectroscopy of Semiconductors and Semiconductor Nanostructures [M]. Berlin: Springer, 1998

[11] . J. Sabbah, D. M. Riffe. Measurement of silicon surface recombination velocity using ultrafast pump-probe reflectivity in the near infrared[J]. J. Appl. Phys., 2000, 88(11): 6954-6956.

[12] . van Driel. Kinetics of high-density plasmas generated in Si by 1.06 and 0.53-μm picosecond laser pulses[J]. Phys. Rev. B, 1987, 35(15): 8166-8176.