[1] Fujiwara,Hiroyuki.Spectroscopic Ellipsometry:Principles and Applications［M］.John Wiley ＆ Sons,2007:1-3.DOI:10.1002/9780470060193.ch1.

[2] Hinrichs,Karsten.Ellipsometry of Functional Organic Surfaces and Films［M］.Berlin:Springer,2014:1-10.DOI:10.1007/978-3-642-40128-2.

[3] Aspnes D E.Spectroscopic Ellipsometry-Past,Present,and Future［J］.Thin Solid Films,2014,571:334-344.DOI:10.1016/j.tsf.2014.03.056.

[4] Tompkins H G,Hilfiker J N.Spectroscopic Ellipsometry:Practical Application to Thin Film Characterization［M］.Momentum Press,2015:1-5.DOI:10.5643/9781606507285.

[5] Chen Y D,Hsu H Y,Khaleel M I,et al.Study of Biological Reaction in Cancer Cell with Spectroscopic Imaging Ellipsometry［C］.Nanoimaging and Nanospectroscopy IV.International Society for Optics and Photonics,2016,9925:992505.DOI:10.1117/12.2236288.

[6] Hansen P E,Madsen J S.Thickness and Refractive Index Analysis of Ellipsometry Data of Ultra-thin Semi-transparent Films［C］.Laser Applications to Chemical,Security and Environmental Analysis.Optical Society of America,2018:JM4A.24.DOI:10.1364/3D.2018.JM4A.24.

[7] Arwin H.Application of Ellipsometry Techniques to Biological Materials［J］.Thin Solid Films,2011,519(9):2589-2592.DOI: 10.1016/j.tsf.2010.11.082.

[8] Azzam R M.Two-reflection Null Ellipsometer Without a Compensator［J］.J Phys E,1976,9(7):569-572.DOI:10.1088/0022-3735/9/7/017.

[9] Chou C,Tsai C C,Teng H K,et al.Balanced Detector Interferometric Ellipsometer［J］.J Opt Soc Am A Opt Image Sci Vis,2006,23(11):2871-2879.DOI:10.1364/JOSAA.23.002871.

[10] Abouraddy A F,Jr T K,Sergienko A V,et al.Ellipsometric Measurements by Use of Photon Pairs Generated by Spontaneous Parametric Downconversion［J］.Optics Letters,2001,26(21):1717-1719.DOI:10.1364/OL.26.001717.

[11] Abouraddy A F,Toussaint K C,Sergienko A V,et al.Entangled-photon Ellipsometry［J］.Journal of the Optical Society of America B,2002,19(4):656-662.DOI:10.1364/JOSAB.19.001174.

[12] Sergienko A V,Saleh B E,Giuseppe G D,et al.Experimental Demonstration of Quantum Ellipsometry［C］.Quantum Electronics and Laser Science,2003.QELS.Postconference Digest.IEEE,2003:5.DOI: 10.1109/QELS.2003.238621.

[13] Toussaint K C,Jr,Giuseppe G D,et al.Quantum Ellipsometry using Correlated-photon Beams［J］.Physical Review A,2004,70(2):690-690.DOI:10.1103/PhysRevA.70.023801.

[14] Graham D J,Parkins A S,Watkins L R.Ellipsometry with Polarisation-entangled Photons［J］.Optics Express,2006,14(16):7037-7045.DOI:10.1364/OE.14.007037.

[15] Simon D S,Jaeger G,Sergienko A V.Quantum Metrology,Imaging,and Communication［M］.Springer,2017:94-97 DOI:10.1007/978-3-319-46551-7.

[16] Lee K F,Chen J,Liang C,et al.Generation of High-purity Telecom-band Entangled Photon Pairs in Dispersion-shifted Fiber［J］.Optics letters,2006,31(12):1905-1907.DOI:10.1109/CLEO.2006.4628576.

[17] Zeidler J R,Kohles R B,Bashara N M.Beam Deviation Errors in Ellipsometric Measurements;An Analysis［J］.Applied Optics,1974,13(8):1938.DOI:10.1364/AO.13.001938.

[18] Lee J,Rovira P I,An I,et al.Rotating-compensator Multichannel Ellipsometry:Applications for Real Time Stokes Vector Spectroscopy of Thin Film Growth［J］.Review of Scientific Instruments,1998,69(4):1800-1810.DOI:10.1063/1.1148844.

[19] Nijs J M M D,Silfhout A V.Systematic and Random Errors in Rotating-analyzer Ellipsometry［J］.Journal of the Optical Society of America A,1988,5(6):773-781.DOI:10.1364/JOSAA.5.000773.

[20] Nijs J M M D,Holtslag A H M,Hoeksta A,et al.Calibration Method for Rotating-analyzer Ellipsometers［J］.Journal of the Optical Society of America A,1988,5(9):1466-1471.DOI:10.1364/JOSAA.5.001466.