提出把散斑图看成随机栅迭加的概念, 用moire方法建立了散斑全场分析的数学描述, 得出与物理过程相符的条纹公式, 并对散斑条纹对比度与试件变形量、滤波孔的关系、散斑条纹图上的二次散斑性质作了讨论。

A mathematical description for considering a speckle gram as superposition of random gratings is proposed, wholefield speckle analysis by moire theory is treated, and a fringe formula which conforms to physical process is obtained. The relation between fringe visibility tested piece deformation and filtering aperture as well as the properties of secondary speckle are discussed.