半导体光子学与技术, 2002, 8 (1): 46, 网络出版: 2011-08-11
Large Curved Surface Measurement
Large Curved Surface Measurement
引用该论文
WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. 半导体光子学与技术, 2002, 8(1): 46.
WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. Semiconductor Photonics and Technology, 2002, 8(1): 46.
参考文献
[1] Yu Laifa. Real Time Theodolite Industry Measure System[M]. Beijing: Survey Publishing Company, 1996. 11-28(in Chinese).
WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. 半导体光子学与技术, 2002, 8(1): 46. WANG Jin-jiang, JIN Su-kun, DI Xu, YANG Zhi-wen. Large Curved Surface Measurement[J]. Semiconductor Photonics and Technology, 2002, 8(1): 46.
PDF全文
