Frontiers of Optoelectronics, 2008, 1 (1): 168, 网络出版: 2012-11-06  

Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity

Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity
作者单位
1 Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
2 Graduate School of the Chinese Academy of Sciences, Beijing 100039, China
引用该论文

Yuan GONG, Bincheng LI. Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity[J]. Frontiers of Optoelectronics, 2008, 1(1): 168.

Yuan GONG, Bincheng LI. Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity[J]. Frontiers of Optoelectronics, 2008, 1(1): 168.

参考文献

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Yuan GONG, Bincheng LI. Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity[J]. Frontiers of Optoelectronics, 2008, 1(1): 168. Yuan GONG, Bincheng LI. Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity[J]. Frontiers of Optoelectronics, 2008, 1(1): 168.

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