光学学报, 2000, 20 (5): 617, 网络出版: 2006-08-09
非恒定环境光条件下的相位测量剖面术
Phase-Measuring Profilometry in Non-Constant Environmental Light
摘要
在野外运用相位测量剖面术(PMP)测量物体三维面型时,环境光场经常发生变化,从而严重影响测量精度。分析了环境光场发生变化对相位测量剖面术的影响,并提出了一种对CCD摄像机获取的条纹图像进行灰度校正的方法。经过校正处理,环境光的影响被大幅度抑制,提高了测量精度。
Abstract
The accuracy of phase-measuring profilometry (PMP) is greatly influenced by the environmental light,especially in the outside of the room.The error caused by the change of the environmental light is analyzed.A method to calibrate the grey scale of the fringe pattern acquired by the CCD camera is presented.By using the method,the error is greatly restrained.
李万松, 苏显渝, 苏礼坤, 向立群. 非恒定环境光条件下的相位测量剖面术[J]. 光学学报, 2000, 20(5): 617. 李万松, 苏显渝, 苏礼坤, 向立群. Phase-Measuring Profilometry in Non-Constant Environmental Light[J]. Acta Optica Sinica, 2000, 20(5): 617.
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