太赫兹科学与电子信息学报, 2018, 16 (5): 845, 网络出版: 2019-06-10
强电磁辐射下X射线条纹相机可靠性分析
Reliability analysis of X-ray streak camera under strong electromagnetic radiation
引用该论文
易涛, 于瑞珍, 胡昕, 杨鸣, 王峰, 李廷帅, 陈铭, 江少恩, 刘慎业. 强电磁辐射下X射线条纹相机可靠性分析[J]. 太赫兹科学与电子信息学报, 2018, 16(5): 845.
YI Tao, YU Ruizhen, HU Xin, YANG Ming, WANG Feng, LI Tingshuai, CHEN Ming, JIANG Shaoen, LIU Shenye. Reliability analysis of X-ray streak camera under strong electromagnetic radiation[J]. Journal of terahertz science and electronic information technology, 2018, 16(5): 845.
易涛, 于瑞珍, 胡昕, 杨鸣, 王峰, 李廷帅, 陈铭, 江少恩, 刘慎业. 强电磁辐射下X射线条纹相机可靠性分析[J]. 太赫兹科学与电子信息学报, 2018, 16(5): 845. YI Tao, YU Ruizhen, HU Xin, YANG Ming, WANG Feng, LI Tingshuai, CHEN Ming, JIANG Shaoen, LIU Shenye. Reliability analysis of X-ray streak camera under strong electromagnetic radiation[J]. Journal of terahertz science and electronic information technology, 2018, 16(5): 845.
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