Photonics Research, 2016, 4 (2): 02000093, Published Online: Sep. 28, 2016
Stochastic collocation for device-level variability analysis in integrated photonics Download: 647次
Integrated optics devices Integrated optics devices Probability theory Probability theory stochastic processes stochastic processes and statistics and statistics Waveguides Waveguides
Abstract
We demonstrate the use of stochastic collocation to assess the performance of photonic devices under the effect of uncertainty. This approach combines high accuracy and efficiency in analyzing device variability with the ease of implementation of sampling-based methods. Its flexibility makes it suitable to be applied to a large range ofphotonic devices. We compare the stochastic collocation method with a Monte Carlo technique on a numerical analysis of the variability in silicon directional couplers.
Yufei Xing, Domenico Spina, Ang Li, Tom Dhaene, Wim Bogaerts. Stochastic collocation for device-level variability analysis in integrated photonics[J]. Photonics Research, 2016, 4(2): 02000093.