Photonics Research, 2016, 4 (3): 03000115, Published Online: Sep. 29, 2016  

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector Download: 635次

Author Affiliations
1 College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China
2 School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
3 Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China
Abstract
By studying the traditional spectral reflectance reconstruction method, spectral reflectance and the relative spectral power distribution of a lighting source are sparsely decomposed, and the orthogonal property of the principal component orthogonal basis is used to eliminate basis; then spectral reflectance data are obtained by solving a sparse coefficient. After theoretical analysis, the spectral reflectance reconstruction based on sparse prior knowledge of the principal component orthogonal basis by a single-pixel detector is carried out by software simulation and experiment. It can reduce the complexity and cost of the system, and has certain significance for the improvement of multispectral image acquisition technology.and the Innovation Project of Shanghai Municipal Education Commission (Grant No. 14YZ099), National Basic Research Program of China (973 Program) (Grant No. 2015CB352004).

Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 03000115.

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